Kramers-Kronig Analysis of Infrared Reflectance Spectra for Quaternary In{sub x}Al{sub y}Ga{sub 1-x-y}N Alloy

Journal Article · Wed Jul 07 04:00:00 EDT 2010 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3469673· OSTI ID:21415268

Raof, N H. Abd.; Ng, S S; Hassan, H Abu; Hassan, Z ^[1]

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1. Nano-Optoelectronics Research Laboratory, School of Physics, Universiti Sains Malaysia, 11800 Penang (Malaysia)

In this paper, a Kramers-Kronig (KK) analysis of infrared (IR) reflectance spectrum of quaternary In{sub 0.01}Al{sub 0.06}Ga{sub 0.93}N film grown by molecular beam epitaxy (MBE) is reported. The infrared measurement is performed in the reflection mode at an incident angle of 15 degree sign by Fourier transform infrared (FTIR) spectroscopy at T = 300 K. The Kramers-Kronig analysis of the reflectivity data has been used to obtain the real and imaginary parts of the index of refraction (n and k), and the real and imaginary parts of the dielectric response function ({epsilon}' and {epsilon}') of the materials. Finally, the transverse optical and longitudinal optical phonons for quaternary In{sub x}Al{sub y}Ga{sub 1-x-y}N were obtained.

• OSTI ID: 21415268
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1250; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
ABSORPTION SPECTROSCOPY
ALLOY SYSTEMS
ALLOYS
ALUMINIUM ALLOYS
CORRELATIONS
CRYSTAL GROWTH METHODS
DIELECTRIC MATERIALS
EPITAXY
FILMS
FOURIER TRANSFORM SPECTROMETERS
FUNCTIONS
GALLIUM ALLOYS
INDIUM ALLOYS
INFRARED SPECTRA
KRAMERS-KRONIG CORRELATION
MATERIALS
MEASURING INSTRUMENTS
MOLECULAR BEAM EPITAXY
NITROGEN COMPOUNDS
OPTICAL PROPERTIES
PHONONS
PHYSICAL PROPERTIES
QUASI PARTICLES
QUATERNARY ALLOY SYSTEMS
REFLECTION
REFLECTIVITY
REFRACTIVE INDEX
RESPONSE FUNCTIONS
SPECTRA
SPECTROMETERS
SPECTROSCOPY
SURFACE PROPERTIES