Kramers-Kronig Analysis of Infrared Reflectance Spectra for Quaternary In{sub x}Al{sub y}Ga{sub 1-x-y}N Alloy
- Nano-Optoelectronics Research Laboratory, School of Physics, Universiti Sains Malaysia, 11800 Penang (Malaysia)
In this paper, a Kramers-Kronig (KK) analysis of infrared (IR) reflectance spectrum of quaternary In{sub 0.01}Al{sub 0.06}Ga{sub 0.93}N film grown by molecular beam epitaxy (MBE) is reported. The infrared measurement is performed in the reflection mode at an incident angle of 15 degree sign by Fourier transform infrared (FTIR) spectroscopy at T = 300 K. The Kramers-Kronig analysis of the reflectivity data has been used to obtain the real and imaginary parts of the index of refraction (n and k), and the real and imaginary parts of the dielectric response function ({epsilon}' and {epsilon}') of the materials. Finally, the transverse optical and longitudinal optical phonons for quaternary In{sub x}Al{sub y}Ga{sub 1-x-y}N were obtained.
- OSTI ID:
- 21415268
- Journal Information:
- AIP Conference Proceedings, Vol. 1250, Issue 1; Conference: PERFIK2009: National physics conference 2009, Malacca (Malaysia), 7-9 Dec 2009; Other Information: DOI: 10.1063/1.3469673; (c) 2010 American Institute of Physics; ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
Similar Records
Kramers-Kronig relations in Laser Intensity Modulation Method
Kramers-Kronig analysis of soft x-ray reflectivity data of platinum thin film in 40-200 Å wavelength region
Related Subjects
ABSORPTION SPECTROSCOPY
ALUMINIUM ALLOYS
DIELECTRIC MATERIALS
FILMS
FOURIER TRANSFORM SPECTROMETERS
GALLIUM ALLOYS
INDIUM ALLOYS
INFRARED SPECTRA
KRAMERS-KRONIG CORRELATION
MOLECULAR BEAM EPITAXY
NITROGEN COMPOUNDS
PHONONS
QUATERNARY ALLOY SYSTEMS
REFLECTION
REFLECTIVITY
REFRACTIVE INDEX
RESPONSE FUNCTIONS
ALLOY SYSTEMS
ALLOYS
CORRELATIONS
CRYSTAL GROWTH METHODS
EPITAXY
FUNCTIONS
MATERIALS
MEASURING INSTRUMENTS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
QUASI PARTICLES
SPECTRA
SPECTROMETERS
SPECTROSCOPY
SURFACE PROPERTIES