Kramers-Kronig analysis of soft x-ray reflectivity data of platinum thin film in 40-200 Å wavelength region

Journal Article · Mon May 23 00:00:00 EDT 2016 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.4947879· OSTI ID:22608658

Sharma, Saurabh ^[1]; Gupta, R. K. ^[1]; Sinha, Mangalika; Singh, Amol ^[2]; Yadav, P.

---

1. Indus Synchrotrons Utilization Division, Raja Ramanna Centre for Advanced Technology, Indore 452 013 (India)
2. Homi Bhabha National Institute, Raja Ramanna Centre for Advanced Technology, Indore 452 013 (India)

Reflectivity beamline at Indus-1 synchrotron source is used to determine optical constants of a platinum thin film in the soft x-ray wavelength region of 40-200Å by applying Kramers-Kronig (KK) technique on R vs wavelength data. Upto 150Å wavelength region the results of KK analysis are found in good agreement with the Henke’s optical constants and also with those obtained by the angle dependent reflectivity technique. A significant mismatch is observed above 150Å wavelength region which could be due to the presence of higher harmonics in the toroidal grating spectra of the reflectivity beamline.

• OSTI ID: 22608658
• Journal Information: AIP Conference Proceedings, Vol. 1731, Issue 1; Conference: DAE solid state physics symposium 2015, Uttar Pradesh (India), 21-25 Dec 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
GRATINGS
HARMONICS
INDUS-1
KRAMERS-KRONIG CORRELATION
PLATINUM
REFLECTIVITY
SOFT X RADIATION
SPECTRA
SYNCHROTRONS
THIN FILMS
WAVELENGTHS