Epitaxial Growth Of Y2O3 On Biaxially Textured Ni Tapes Using A Sol-Gel Process For YBCO Coated Conductors
- Technical University of Cluj-Napoca, Cluj-Napoca (Romania)
A solution processing technique was used to deposit an epitaxial Y2O3 film on (001)[100] cube textured Ni tapes for YBa2Cu3Ox (YBCO) coated conductors manufacturing. The cube texture was developed in Ni by a conventional thermo-mechanical process. A precursor solution of yttrium 2-methoxyethoxide in 2-methoxyethanol was spin-coated on the Ni substrate. The as-deposited amorphous film was thermally treated at 1100 deg. C in a flowing Ar+4%H2 gas mixture. The {theta}-2{theta} X-ray spectra revealed predominantly (001) reflections, indicating a high degree of out-of-plane orientation. Pole figures for the (222) Y2O3 reflections demonstrate a single in-plane texture. The out-of-plane and in-plane epitaxial relationship is [400]Y2O3//[200] Ni and [110]Y2O3//[100] Ni, respectively. The full-width-half-maximum (FWHM) of the {omega}-scans and {phi}-scans is 6 deg. and 11 deg. , respectively.
- OSTI ID:
- 21057223
- Journal Information:
- AIP Conference Proceedings, Vol. 899, Issue 1; Conference: 6. international conference of the Balkan Physical Union, Istanbul (Turkey), 22-26 Aug 2006; Other Information: DOI: 10.1063/1.2733361; (c) 2007 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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