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Epitaxial growth of gadolinium oxide on roll-textured nickel using a solution growth technique

Journal Article · · Journal of Materials Research
DOI:https://doi.org/10.1557/JMR.2000.0092· OSTI ID:20216852
 [1];  [1];  [2];  [2];  [2];  [2];  [3];  [3];  [3];  [4]
  1. Department of Chemistry, University of Tennessee, Knoxville, Tennessee 37996 (United States)
  2. Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)
  3. Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)
  4. Chemical and Analytical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)
Chemical solution epitaxy was used to deposit an epitaxial film of Gd{sub 2}O{sub 3} on roll-textured nickel. A 2-methoxyethanol solution of gadolinium methoxyethoxide was used for spin-coating and dip-coating. Films were crystallized using a heat treatment at 1160 degree sign C for 1 h in 4%H{sub 2}/96%Ar. Single-layer films were approximately 600 Aa in thickness, and thicker films could be produced using multiple coatings. {theta}/2{theta} x-ray diffractograms revealed only (0041) reflections, indicating a high degree of out-of-plane texture. A pole-figure about the Gd{sub 2}O{sub 3} (222) reflection indicated a single in-plane epitaxy. Scanning electron microscopy showed that the films were smooth, continuous, and free of pin holes. Atomic force microscopy revealed an average surface roughness of 53 Aa. Electron diffraction indicated that the misalignment of the majority of the grains in the plane was less than 10 degree sign . High-current (0.4 MA/cm2) YBa{sub 2}Cu{sub 3}O{sub 7-{delta}} films were grown on roll-textured nickel substrates using Gd{sub 2}O{sub 3} as the base layer in a three-layer buffer structure. (c) 2000 Materials Research Society.
OSTI ID:
20216852
Journal Information:
Journal of Materials Research, Journal Name: Journal of Materials Research Journal Issue: 3 Vol. 15; ISSN JMREEE; ISSN 0884-2914
Country of Publication:
United States
Language:
English