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Title: Thermoelectric properties of p-type pseudo-binary (Ag{sub 0.365}Sb{sub 0.558}Te) {sub x} -(Bi{sub 0.5}Sb{sub 1.5}Te{sub 3}){sub 1-} {sub x} (x=0-1.0) alloys prepared by spark plasma sintering

Journal Article · · Journal of Solid State Chemistry
 [1];  [2];  [2];  [2];  [2]
  1. School of Mechanical Engineering, Ningbo University of Technology, Ningbo 315016 (China)
  2. School of Materials Science and Engineering, China University of Mining and Technology, Xuzhou 221008 (China)

In this paper, pseudo-binary (Ag{sub 0.365}Sb{sub 0.558}Te) {sub x} -(Bi{sub 0.5}Sb{sub 1.5}Te{sub 3}){sub 1-} {sub x} (x=0-1.0) alloys were prepared using spark plasma sintering technique, and the composition-dependent thermoelectric properties were evaluated. Electrical conductivities range from 7.9x10{sup 4} to 15.6x10{sup 4} {omega}{sup -1} m{sup -1} at temperatures of 507 and 318 K, respectively, being about 3.0 and 8.5 times those of Bi{sub 0.5}Sb{sub 1.5}Te{sub 3} alloy at the corresponding temperatures. The optimal dimensionless figure of merit (ZT) of the sample with molar fraction x=0.025 reaches 1.1 at 478 K, whereas that of the ternary Bi{sub 0.5}Sb{sub 1.5}Te{sub 3} alloy is 0.58 near room temperature. The results also reveal that a direct introduction of Ag{sub 0.365}Sb{sub 0.558}Te in the Bi-Sb-Te system is much more effective to the property improvement than naturally precipitated Ag{sub 0.365}Sb{sub 0.558}Te in the Ag-doped Ag-Bi-Sb-Te system. - Graphical abstract: The temperature dependence of the dimensionless thermoelectric figure of merit ZT for different (Ag{sub 0.365}Sb{sub 0.558}Te) {sub x} -(Bi{sub 0.5}Sb{sub 1.5}Te{sub 3}){sub 1-} {sub x} (x=0-1.0) alloys prepared by spark plasma sintering.

OSTI ID:
20900915
Journal Information:
Journal of Solid State Chemistry, Vol. 179, Issue 12; Other Information: DOI: 10.1016/j.jssc.2006.08.016; PII: S0022-4596(06)00463-4; Copyright (c) 2006 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 0022-4596
Country of Publication:
United States
Language:
English