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Thin film deposition on powder surfaces using atmospheric pressure discharge

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.2134635· OSTI ID:20726784
; ;  [1]
  1. Institute for Low Temperature Plasma Physics, F.-L.-Jahn-Str.19, 17489 Greifswald (Germany)

The deposition of SiOx containing films on NaCl and KBr particles in dielectric barrier discharge under atmospheric pressure was investigated. As precursor hexamethyldisiloxane (HMDSO) and tetraethoxysilane (TEOS) in argon-oxygen gas mixtures were used. The deposited layers were studied by means of light microscopy, SEM and XPS investigations. The particles could be completely covered by SiOx. With increasing oxygen content in the coating the carbon content decreases.

OSTI ID:
20726784
Journal Information:
AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 799; ISSN APCPCS; ISSN 0094-243X
Country of Publication:
United States
Language:
English

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