Microstructure and dielectric properties of Ba{sub 1-x}Sr{sub x}TiO{sub 3} films grown on LaAlO{sub 3} substrates

Journal Article · Mon Aug 21 04:00:00 EDT 2000 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.1289272· OSTI ID:20217316

Gim, Y ^[1]; Hudson, T ^[1]; Fan, Y ^[1]; Kwon, C ^[1]; Findikoglu, A T ^[1]; Gibbons, B J ^[1]; Park, B H ^[1]; Jia, Q X ^[1]

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1. Superconductivity Technology Center, Mail Stop K763, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)

We report a systematic study of the microstructure and dielectric properties of barium strontium titanate, Ba{sub 1-x}Sr{sub x}TiO{sub 3}, films grown by laser ablation on LaAlO{sub 3} substrates, where x=0.1-0.9 at an interval of 0.1. X-ray diffraction analysis shows that when x<0.4, the longest unit-cell axis is parallel to the plane of the substrate but perpendicular as x approaches 1. Dielectric constant versus temperature measurements show that the relative dielectric constant has a maximum value and that the peak temperatures corresponding to the maximum relative dielectric constant are about 70 degree sign C higher when x{<=}0.4 but similar when x>0.4, compared with the peak temperatures of the bulk Ba{sub 1-x}Sr{sub x}TiO{sub 3}. At room temperature, the dielectric constant and tunability are relatively high when x{<=}0.4 but start to decrease rapidly as x increases. (c) 2000 American Institute of Physics.

• OSTI ID: 20217316
• Journal Information: Applied Physics Letters, Journal Name: Applied Physics Letters Journal Issue: 8 Vol. 77; ISSN APPLAB; ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
BARIUM OXIDES
DIELECTRIC PROPERTIES
EXPERIMENTAL DATA
MICROSTRUCTURE
STRONTIUM OXIDES
TEMPERATURE DEPENDENCE
THIN FILMS
TITANIUM OXIDES
X-RAY DIFFRACTION