Pulsed laser deposition of epitaxial Ba{sub x}Sr{sub 1{minus}x}TiO{sub 3}/YBa{sub 2}Cu{sub 3}O{sub 7} bilayers on LaAlO{sub 3} substrates

Journal Article · Thu Sep 01 04:00:00 EDT 1994 · Journal of Electronic Materials

DOI:https://doi.org/10.1007/BF02655357· OSTI ID:62431

Harkness, S D; Yue, C F; Borek, M A; Singh, R K ^[1]

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1. Univ. of Florida, Gainesville, FL (United States)

YBa{sub 2}Cu{sub 3}O{sub 7}/Ba{sub x}Sr{sub 1{minus}x}TiO{sub 8} bilayers were grown epitaxially on LaAlO{sub 3} substrates using the pulsed laser deposition method. A microstructural investigation revealed that all compositions of Ba{sub x}Sr{sub 1{minus}x}TiO{sub 3} investigated from x = 0 to x = 1 showed (001) orientation and epitaxy across the interface as analyzed by Rutherford backscattering spectroscopy channel yields of <8% for BaTiO{sub 8} on YBa{sub 2}Cu{sub 3}O{sub 7} films. Dielectric properties including the dielectric constant, k, and the loss tangent, tan {delta}, were measured as a function of composition, and it was found that the highest k-values (k = 400) existed for the x = 0.72 composition. 9 refs., 4 figs., 2 tabs.

• Sponsoring Organization: USDOE
• OSTI ID: 62431
• Report Number(s): CONF-9302103--
• Journal Information: Journal of Electronic Materials, Journal Name: Journal of Electronic Materials Journal Issue: 9 Vol. 23; ISSN JECMA5; ISSN 0361-5235
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
40 CHEMISTRY
42 ENGINEERING
ABLATION
BARIUM COMPOUNDS
DEPOSITION
DIELECTRIC PROPERTIES
EPITAXY
FILMS
LASERS
MICROSTRUCTURE
OXIDES
USES
X-RAY DIFFRACTION
X-RAY SPECTRA
YTTRIUM COMPOUNDS