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Structural and dielectric properties of Ba[sub 0.6]Sr[sub 0.4]TiO[sub 3] thin films

Conference ·
OSTI ID:977850
We report a systematic study of the structural and dielectric properties of barium strontium titanate, Ba{sub 0.6}Sr{sub 0.4}TiO{sub 3} (BST-0.4), films grown by pulsed laser deposition on LaAlO{sub 3} and MgO substrates. By optimizing the processing conditions, choosing appropriate substrate materials, and constructing layered architectures, we have successfully deposited BST-0.4 films on both LaAlO{sub 3} and MgO substrates with large dielectric nonlinearity and low dielectric loss. X-ray diffraction and transmission electron microscopy analyses reveal that the dielectric tunability and the dielectric loss are closely related to the crystallinity of the BST-0.4 films. We have also observed that a small variation of D value, defined as the ratio of in-plane lattice constant/out-of-plane lattice constant, can result in a significantly large change of dielectric properties of the BST films.
Research Organization:
Los Alamos National Laboratory
Sponsoring Organization:
DOE
OSTI ID:
977850
Report Number(s):
LA-UR-04-6358
Country of Publication:
United States
Language:
English