Structural and dielectric properties of Ba[sub 0.6]Sr[sub 0.4]TiO[sub 3] thin films
- Jang-sik
- Bae Ho
- Ping
We report a systematic study of the structural and dielectric properties of barium strontium titanate, Ba{sub 0.6}Sr{sub 0.4}TiO{sub 3} (BST-0.4), films grown by pulsed laser deposition on LaAlO{sub 3} and MgO substrates. By optimizing the processing conditions, choosing appropriate substrate materials, and constructing layered architectures, we have successfully deposited BST-0.4 films on both LaAlO{sub 3} and MgO substrates with large dielectric nonlinearity and low dielectric loss. X-ray diffraction and transmission electron microscopy analyses reveal that the dielectric tunability and the dielectric loss are closely related to the crystallinity of the BST-0.4 films. We have also observed that a small variation of D value, defined as the ratio of in-plane lattice constant/out-of-plane lattice constant, can result in a significantly large change of dielectric properties of the BST films.
- Research Organization:
- Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
- Sponsoring Organization:
- USDOE
- OSTI ID:
- 977850
- Report Number(s):
- LA-UR-04-6358; TRN: US201012%%768
- Resource Relation:
- Conference: Submitted to: Proceedings of the Electrochemical Society, Epitaxial Growth of Functional Oxides, International Symposium, October 12-17. 2004, Orlando, FL
- Country of Publication:
- United States
- Language:
- English
Similar Records
Dielectric properties of <001>-oriented Ba{sub 0.6}Sr{sub 0.4}TiO{sub 3} thin films on polycrystalline metal tapes using biaxially oriented MgO/{gamma}-Al{sub 2}O{sub 3} buffer layers
Microstructure and dielectric properties of Ba{sub 1-x}Sr{sub x}TiO{sub 3} films grown on LaAlO{sub 3} substrates