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Office of Scientific and Technical Information
 

Total ionizing dose and single event effects on 12-nm bulk FinFETs.

Conference ·
DOI:https://doi.org/10.2172/2001871· OSTI ID:2001871
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Abstract not provided.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
NA0003525
OSTI ID:
2001871
Report Number(s):
SAND2022-2273C; 703719
Country of Publication:
United States
Language:
English

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