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Single Event Upset and Total Ionizing Dose Response of 12LP FinFET Digital Circuits.

Conference ·
DOI:https://doi.org/10.2172/2004078· OSTI ID:2004078
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Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States); Sandia National Laboratories,, Livermore, CA
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
NA0003525
OSTI ID:
2004078
Report Number(s):
SAND2022-9661C; 708298
Country of Publication:
United States
Language:
English

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