Comparison between (60)Co ground tests and CRRES space flight data. (Reannouncement with new availability information)

Technical Report · Tue Dec 01 04:00:00 EST 1992

OSTI ID:200126

Ray, K P; Mullen, E G; Bradley, T E; Zimmerman, D M; Duff, E A

This paper presents results of microelectronic device degradation due to total dose as measured on the Combined Release and Radiation Effects Satellite (CRRES). The on-orbit device performance is compared to MIL-STD-883 Method 1019.2 60Co ground test performance on like devices. Although experimental factors introduce uncertainties, the comparisons show that space degradation reasonably matches high dose rate 60Co testing for many parts types, while other part types show significant differences. However, even where differences exist, the degradation is within a factor of three between the space and ground tested parts. Due to the vintage of the parts flown and the unexpectedly short duration of the mission, the space results do not provide a basis for evaluating the changes incorporated into the new MIL-STD-883 Method 1019.4 which addresses dose rate effects in more detail.

• Research Organization: Phillips Lab., Hanscom AFB, MA (United States)
• OSTI ID: 200126
• Report Number(s): AD-A--262835/2/XAB; PL-TR--93-2075
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
COBALT 60
COMPARATIVE EVALUATIONS
GAMMA RADIATION
GROUND LEVEL
MICROELECTRONICS
PHYSICAL RADIATION EFFECTS
SPACE FLIGHT