Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Etching of GaAs/AlGaAs rib waveguide structures using BCl{sub 3}/CI{sub 2}/N{sub 2}/Ar electron cyclotron resonance

Journal Article · · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena
DOI:https://doi.org/10.1116/1.588128· OSTI ID:184101
 [1]; ;  [2]
  1. Plasma Therm IP, St. Petersburg, FL (United States)
  2. Sandia National Labs., Albuquerque, NM (United States); and others

An anisotropic nonselective etch for GaAs/AlGaAs rib waveguides has been developed for use under electron cyclotron resonance conditions. The plasma chemistry features BCl{sub 3} to minimize AlGaAs oxidation effects and small additions of N{sub 2} to induce sidewall protection when using photoresist masks. The fundamental mode attenuation in GaAs/AlGaAs waveguides is sensitive to the choice of both plasma chemistry and making material, but can be reduced to < 1 dB cm{sup -1} for channel widths of 4-5 {mu}m. 36 refs., 10 figs.

OSTI ID:
184101
Journal Information:
Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 5 Vol. 13; ISSN 0734-211X; ISSN JVTBD9
Country of Publication:
United States
Language:
English

Similar Records

Masking considerations in chemically assisted ion beam etching of GaAs/AlGaAs laser structures
Journal Article · Tue Feb 28 23:00:00 EST 1989 · J. Electrochem. Soc.; (United States) · OSTI ID:5777295

ECR etching of GaP, GaAs, InP, and InGaAs in Cl{sub 2}/Ar, Cl{sub 2}/N{sub 2}, BCl{sub 3}/Ar, and BCl{sub 3}/N{sub 2}
Technical Report · Sat Jun 01 00:00:00 EDT 1996 · OSTI ID:244631

Dead-time-free selective dry etching of GaAs/AlGaAs using BCl{sub 3}/CHF{sub 3} plasma
Journal Article · Mon Oct 31 23:00:00 EST 1994 · Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena · OSTI ID:263450