Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Multiscale System Modeling of Single Event Induced Faults in Advanced Node Processors.

Conference ·
DOI:https://doi.org/10.2172/1831591· OSTI ID:1831591
Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States); Sandia National Laboratories, Livermore, CA
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
NA0003525
OSTI ID:
1831591
Report Number(s):
SAND2020-12163C; 692321
Country of Publication:
United States
Language:
English

Similar Records

Fault Tracking and Modeling in Advanced Node Processors of Single Event Effects.
Conference · Tue Sep 01 00:00:00 EDT 2020 · OSTI ID:1822293

Multiscale Modeling of Single Event-Induced Faults in FinFET-based Processors.
Conference · Wed Jul 01 00:00:00 EDT 2020 · OSTI ID:1810050

Multiscale System Modeling of Single-Event-Induced Faults in Advanced Node Processors
Journal Article · Tue May 04 20:00:00 EDT 2021 · IEEE Transactions on Nuclear Science · OSTI ID:1787522

Related Subjects