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U.S. Department of Energy
Office of Scientific and Technical Information

Multiscale Modeling of Single Event-Induced Faults in FinFET-based Processors.

Conference ·
OSTI ID:1810050
Abstract not provided.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States); Sandia National Laboratories, Livermore, CA
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000;
OSTI ID:
1810050
Report Number(s):
SAND2020-7327C; 687438
Conference Information:
Proposed for presentation at the Nuclear & Space Radiation Effects Conference.
Country of Publication:
United States
Language:
English