Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Photocurrent from Single Collision 14 MeV Neutrons in GaN and GaAs

Journal Article · · IEEE Transactions on Nuclear Science

Accurate predictions of device performance in 14 MeV neutron environments relies upon understanding the recoil cascades that may be produced. Recoils from 14 MeV neutrons impinging on both gallium nitride (GaN) and gallium arsenide (GaAs) devices were modeled and compared to the recoil spectra of devices exposed to 14 MeV neutrons. Recoil spectra were generated using nuclear reaction modeling programs and converted into an ionizing energy loss (IEL) spectrum. We measured the recoil IEL spectra by capturing the photocurrent pulses produced by single neutron interactions with the device. Good agreement, with a factor of two, was found between the model and experiment under strongly-depleted conditions. However, this range of agreement between model and experiment decreased significantly when the bias was removed, indicating partial energy deposition due to cascades that escape the active volume of the device not captured by the model. Consistent event rates across multiple detectors confirm the reliability of our neutron recoil detection method.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA), Office of Defense Nuclear Security (NA-70)
Grant/Contract Number:
AC04-94AL85000
OSTI ID:
1574699
Report Number(s):
SAND--2019-11380J; 679523
Journal Information:
IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 1 Vol. 67; ISSN 0018-9499
Publisher:
IEEECopyright Statement
Country of Publication:
United States
Language:
English

Similar Records

Crystalline growth of wurtzite GaN on (111) GaAs
Conference · Sat Nov 30 23:00:00 EST 1991 · OSTI ID:10181825

Crystalline growth of wurtzite GaN on (111) GaAs
Conference · Sat Nov 30 23:00:00 EST 1991 · OSTI ID:6959725

Simulation of the transient radiation response for GaAs thyristors
Conference · Fri Nov 30 23:00:00 EST 1990 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (USA) · OSTI ID:5878801