Understanding Chemical Inhomogeneities and Cation Gradients in Perovskite Photovoltaics with TOF-SIMS

Conference · Thu Nov 29 04:00:00 EST 2018

DOI:https://doi.org/10.1109/PVSC.2018.8548045· OSTI ID:1507665

Harvey, Steven P ^[1]

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1. National Renewable Energy Laboratory (NREL), Golden, CO (United States)

Time-of-flight secondary-ion mass spectrometry (TOF-SIMS) is one of the few techniques that can obtain chemical information from all components of hybrid organic-inorganic perovskite photovoltaics in up to three dimensions. This can yield critical insight into the uniformity of the cations through the thickness of the film (with sub-nm resolution), as well as laterally (with 100nm resolution) We have been using a TOF-SIMS to analyze perovskite photovoltaics at NREL for more than four years and have found many tricks and best practices, summarized here, to get around known artifacts when depth profiling and imaging.

• Research Organization: National Renewable Energy Laboratory (NREL), Golden, CO (United States)
• Sponsoring Organization: USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
• DOE Contract Number: AC36-08GO28308
• OSTI ID: 1507665
• Report Number(s): NREL/CP-5K00-70837
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
36 MATERIALS SCIENCE
TOF-SIMS
gradients
inhomogeneities
perovskite
photovoltaics