Understanding Measurement Artifacts Causing Inherent Cation Gradients in Depth Profiles of Perovskite Photovoltaics with TOF-SIMS

Conference · Thu Feb 06 04:00:00 EST 2020

DOI:https://doi.org/10.1109/PVSC40753.2019.8980549· OSTI ID:1603902

Harvey, Steven P ^[1]; Zhang, Fei ^[1]; Palmstrom, Axel ^[1]; Zhu, Kai ^[1]; Luther, Joseph M ^[1]; Berry, Joseph J ^[1]

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1. National Renewable Energy Laboratory (NREL), Golden, CO (United States)

Time-of-flight secondary-ion mass spectrometry (TOF-SIMS) is one of the few techniques that can obtain chemical information from the hybrid organic-inorganic perovskite solar cells (PSCs) in one dimension (standard depth profiling), two dimensions (high-resolution 100-nm imaging), as well as three dimensions (tomography combining high-resolution imaging with depth profiling). We have very recently developed thermo-mechanical methods to cleave perovskite samples at the back transparent conducting oxide/PSC interface. This allowed for depth-profiling from the back of the device to the front. The resultant profiles answered the lingering question of the apparent A-site cation gradient typically seen in TOF-SIMS depth profiles. In fact, this gradient is a measurement artifact due to beam damage that the community should be informed of as TOF-SIMS data become more commonly employed. Methods of mitigating this artifact by altering the measurement conditions are also presented.

• Research Organization: National Renewable Energy Laboratory (NREL), Golden, CO (United States)
• Sponsoring Organization: USDOE Office of Energy Efficiency and Renewable Energy (EERE), Solar Energy Technologies Office (EE-4S)
• DOE Contract Number: AC36-08GO28308
• OSTI ID: 1603902
• Report Number(s): NREL/CP-5K00-74078
• Country of Publication: United States
• Language: English

Related Subjects

14 SOLAR ENERGY
36 MATERIALS SCIENCE
TOF-SIMS
gradients
inhomogeneities
perovskite
photovoltaics