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Effects of Stopping Ions and LET Fluctuations on Soft Error Rate Prediction.

Journal Article · · IEEE Transactions on Nuclear Science
 [1];  [2];  [3];  [4];  [1];  [1];  [1];  [1];  [5];  [1];  [1];  [6]
  1. Vanderbilt Univ., Nashville, TN (United States)
  2. Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
  3. Dynetics, Inc., Huntsville, AL (United States)
  4. Intel Corp, Santa Clara, CA (United States)
  5. National Inst. of Standards and Technology (NIST), Gaithersburg, MD (United States)
  6. Texas Instruments Inc., Dallas, TX (United States)
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Variability in energy deposition from stopping ions and LET fluctuations is quantified for specific radiation environments. When compared to predictions using average LET via CREME96, LET fluctuations lead to an order-of-magnitude difference in effective flux and a nearly 4x decrease in predicted soft error rate (SER) in an example calculation performed on a commercial 65 nm SRAM. The large LET fluctuations reported here will be even greater for the smaller sensitive volumes that are characteristic of highly scaled technologies. End-of-range effects of stopping ions do not lead to significant inaccuracies in radiation environments with low solar activity unless the sensitivevolume thickness is 100 μm or greater. In contrast, end-of-range effects for stopping ions lead to significant inaccuracies for sensitive- volume thicknesses less than 10 μm in radiation environments with high solar activity.
Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States); Sandia National Laboratories, Albuquerque, NM
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC04-94AL85000
OSTI ID:
1427234
Report Number(s):
SAND--2015-0718J; 563556
Journal Information:
IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 5 Vol. 62; ISSN 0018-9499
Publisher:
IEEECopyright Statement
Country of Publication:
United States
Language:
English

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