Calculation of the soft error rate of submicron CMOS logic circuits
Journal Article
·
· IEEE Journal of Solid-State Circuits
- Technical Univ. Berlin (Germany). Inst. of Microelectronics
A method to calculate the soft error rate (SER) of CMOS logic circuits with dynamic pipeline registers is described. This method takes into account charge collection by drift and diffusion. The method is verified by comparison of calculated SER`s to measurement results. Using this method, the SER of a highly pipelined multiplier is calculated as a function of supply voltage for a 0.6 {micro}m, 0.3 {micro}m, and 0.12 {micro}m technology, respectively. It has been found that the SER of such highly pipelined submicron CMOS circuits may become too high so that countermeasures have to be taken. Since the SER greatly increases with decreasing supply voltage, low-power/low-voltage circuits may show more than eight times the SER for half the normal supply voltage as compared to conventional designs.
- OSTI ID:
- 131617
- Journal Information:
- IEEE Journal of Solid-State Circuits, Journal Name: IEEE Journal of Solid-State Circuits Journal Issue: 7 Vol. 30; ISSN IJSCBC; ISSN 0018-9200
- Country of Publication:
- United States
- Language:
- English
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