X-ray photoemission analysis of chemically modified TlBr surfaces for improved radiation detectors

Nelson, A. J.; Voss, L. F.; Beck, P. R.; Graff, R. T.; Conway, A. M.; Nikolic, R. J.; Payne, S. A.; Lee, J. -S.; Kim, H.; Cirignano, L.; Shah, K.

doi:10.1063/1.4801793

X-ray photoemission analysis of chemically modified TlBr surfaces for improved radiation detectors

Journal Article · Sat Jan 12 00:00:00 EST 2013 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4801793· OSTI ID:1240070

Nelson, A. J. ^[1]; Voss, L. F. ^[1]; Beck, P. R. ^[1]; Graff, R. T. ^[1]; Conway, A. M. ^[1]; Nikolic, R. J. ^[1]; Payne, S. A. ^[1]; Lee, J. -S. ^[2]; Kim, H. ^[3]; Cirignano, L. ^[3]; Shah, K. ^[3]

Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
SLAC National Accelerator Lab., Menlo Park, CA (United States). Stanford Synchrotron Radiation Lightsource (SSRL)
Radiation Monitoring Devices, Watertown, MA (United States)

We subjected device-grade TlBr to various chemical treatments used in room temperature radiation detector fabrication to determine the resulting surface composition and electronic structure. As-polished TlBr was treated separately with HCl, SOCl₂, Br:MeOH and HF solutions. High-resolution photoemission measurements on the valence band electronic structure and Tl 4f, Br 3d, Cl 2p and S 2p core lines were used to evaluate surface chemistry and shallow heterojunction formation. Surface chemistry and valence band electronic structure were correlated with the goal of optimizing the long-term stability and radiation response.

View Accepted Manuscript (DOE)

Research Organization:: Lawrence Livermore National Laboratory (LLNL), Livermore, CA

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC52-07NA27344

OSTI ID:: 1240070

Report Number(s):: LLNL-JRNL-623312

Journal Information:: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 14 Vol. 113; ISSN JAPIAU; ISSN 0021-8979

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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