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A Bistable Divacancy-Like Defect in Silicon Damage Cascades.

Journal Article · Mon Dec 31 23:00:00 EST 2007 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.2991135· OSTI ID:1142838

Fleming, Robert M.; Bielejec, Edward S.; Campbell, Jonathan; Seager, C. H.; Lang, D. V.

Abstract not provided.

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Research Organization:: Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

DOE Contract Number:: AC04-94AL85000

OSTI ID:: 1142838

Report Number(s):: SAND2008-5270J; 517285

Journal Information:: Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 8 Vol. 104; ISSN 0021-8979

Publisher:: American Institute of Physics (AIP)

Country of Publication:: United States

Language:: English

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