Effects of high G-loading on MEMS structure and die attachment.

Conference · Sun Aug 01 00:00:00 EDT 2010

OSTI ID:1122464

Marinis, Ryan T.; Hefti, Peter; Soucy, Joe W.; Ruffin, Paul B.; Zwiener, Mark; Pryputniewicz, Ryszard J.

Abstract not provided.

• Research Organization: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
• Sponsoring Organization: USDOE National Nuclear Security Administration (NNSA)
• DOE Contract Number: AC04-94AL85000
• OSTI ID: 1122464
• Report Number(s): SAND2010-5710C; 491600
• Resource Relation: Conference: Proposed for presentation at the IMPLAST 2010, SEM 2010 Fall Conference held October 12-14, 2010 in Providence, RI.
• Country of Publication: United States
• Language: English