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U.S. Department of Energy
Office of Scientific and Technical Information

Effects of high G-loading on MEMS structure and die attachment.

Conference ·
OSTI ID:1122464

Abstract not provided.

Research Organization:
Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1122464
Report Number(s):
SAND2010-5710C; 491600
Country of Publication:
United States
Language:
English

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