Transient photoconductivity of low temperature GaAs grown by molecular beam epitaxy terahertz radar applications
Conference
·
OSTI ID:10140735
Optoelectronic sampling techniques have been utilized to characterize transient photoconductivity in low temperature (LT) GaAs grown by molecular beam epitaxy (MBE). Metal-semiconductor-metal (MSM) photoconductive devices have been fabricated on LT-GaAs layers grown at a ``calibrated`` substrate temperature of 190{degrees}C. Results from on-chip photoconductive sampling measurements demonstrate the ability to generate, propagate, and detect photocurrent pulses of {approximately}4ps duration, which is limited by the optoelectronic measurement system. A carrier mobility of 120 cm{sup 2}/V-s has been estimated from these results, which is a factor of 5--10 times larger than alternative materials used for picosecond photoconductivity. This translates to improved sensitivity for emission and detection of terahertz pulses of electromagnetic (EM) radiation. 10 refs.
- Research Organization:
- Lawrence Livermore National Lab., CA (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 10140735
- Report Number(s):
- UCRL-JC--108738; CONF-911267--3; ON: DE92011848
- Country of Publication:
- United States
- Language:
- English
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