THE STRUCTURE OF GRAIN BOUNDARIES IN SILICON NITRIDE BASED ALLOYS
Conference
·
OSTI ID:1004881
Grain boundaries in silicon-based ceramics have been characterized by high resolution electron microscopy including the technique of lattice fringe imaging, and this work is illustrated with examples from both hot-pressed silicon nitrides (MgO and Y{sub 2}O{sub 3} fluxed) and a magnesium-sialon (Mg{sub 1.86} Si{sub 1.67} Al{sub 2.47} O{sub 3.19} N{sub 3.81}). Room temperature observations of the glassy phase are consistent with it being only a partially wetting phase, indicating that it cannot form a continuous film. The atomic configuration of the grain boundaries in both materials is presented together with lattice fringe observations of segregation at grain boundaries in the magnesium-sialon.
- Research Organization:
- Ernest Orlando Lawrence Berkeley National Laboratory, Berkeley, CA (US)
- Sponsoring Organization:
- Chemical Sciences Division
- DOE Contract Number:
- AC02-05CH11231
- OSTI ID:
- 1004881
- Report Number(s):
- LBL-6985
- Country of Publication:
- United States
- Language:
- English
Similar Records
Structure of grain boundaries in silicon nitride based alloys
Direct observation of lattice planes at grain boundaries in silicon nitride
Grain boundary phases in a hot-pressed MgO fluxed silicon nitride
Conference
·
Wed Nov 30 23:00:00 EST 1977
·
OSTI ID:5094885
Direct observation of lattice planes at grain boundaries in silicon nitride
Conference
·
Wed Sep 01 00:00:00 EDT 1976
·
OSTI ID:7234784
Grain boundary phases in a hot-pressed MgO fluxed silicon nitride
Journal Article
·
Mon Oct 31 23:00:00 EST 1977
· J. Am. Ceram. Soc.; (United States)
·
OSTI ID:6824915