Structure of grain boundaries in silicon nitride based alloys

Conference · Thu Dec 01 04:00:00 EST 1977

OSTI ID:5094885

Clarke, D R; Thomas, G

Grain boundaries in silicon-based ceramics have been characterized by high resolution electron microscopy including the technique of lattice fringe imaging, and this work is illustrated with exxamples from both hot-pressed silicon nitrides (MgO and Y/sub 2/O/sub 3/ fluxed) and a magnesium-sialon (Mg/sub 1/./sub 86/ Si/sub 1/./sub 67/ Al/sub 2/./sub 47/ O/sub 3/./sub 19/ N/sub 3/./sub 81/). Room temperature observations of the glassy phase are consistent with it being only a partially wetting phase, indicating that it cannot form a continuous film. The atomic configuration of the grain boundaries in both materials is presented together with lattice fringe observations of segregation at grain boundaries in the magnesium-sialon.

• Research Organization: Rockwell International Corp., Thousand Oaks, Calif. (USA). Science Center; California Univ., Berkeley (USA). Lawrence Berkeley Lab.
• DOE Contract Number: W-7405-ENG-48
• OSTI ID: 5094885
• Report Number(s): LBL-6985; CONF-771137-3
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
ALKALINE EARTH METAL COMPOUNDS
CERAMICS
CHALCOGENIDES
CRYSTAL STRUCTURE
GRAIN BOUNDARIES
MAGNESIUM COMPOUNDS
MAGNESIUM OXIDES
MICROSTRUCTURE
NITRIDES
NITROGEN COMPOUNDS
OXIDES
OXYGEN COMPOUNDS
PNICTIDES
SILICON COMPOUNDS
SILICON NITRIDES
TRANSITION ELEMENT COMPOUNDS
YTTRIUM COMPOUNDS
YTTRIUM OXIDES