Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Grain boundary phases in a hot-pressed MgO fluxed silicon nitride

Journal Article · · J. Am. Ceram. Soc.; (United States)

Although high-temperature strength loss in ceramics, such as silicon nitride, has been attributed to the presence of intergranular amorphous phases, until now no direct proof has been offered. This paper describes high resolution electron microscopy lattice imaging studies of an MgO fluxed hot-pressed silicon nitride. These studies indicate that intergranular second phases do indeed exist, but they are heterogeneously distributed, appearing especially at multiple grain junctions. These room temperature observations are compatible with the microstructures expected at elevated temperatures.

Research Organization:
Univ. of California, Berkeley
OSTI ID:
6824915
Journal Information:
J. Am. Ceram. Soc.; (United States), Journal Name: J. Am. Ceram. Soc.; (United States) Vol. 60:11-12; ISSN JACTA
Country of Publication:
United States
Language:
English