Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy
Abstract
Using a signal-to-noise ratio estimation based on correlations between multiple simulated images, we compare the dose efficiency of two soft x-ray imaging systems: incoherent brightfield imaging using zone plate optics in a transmission x-ray microscope (TXM), and x-ray diffraction microscopy (XDM) where an image is reconstructed from the far-field coherent diffraction pattern. In XDM one must computationally phase weak diffraction signals; in TXM one suffers signal losses due to the finite numerical aperture and efficiency of the optics. In simulations with objects representing isolated cells such as yeast, we find that XDM has the potential for delivering equivalent resolution images using fewer photons. As a result, this can be an important advantage for studying radiation-sensitive biological and soft matter specimens.
- Authors:
-
- Stony Brook Univ., Stony Brook, NY (United States)
- Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
- Publication Date:
- Research Org.:
- Stony Brook Univ., NY (United States)
- Sponsoring Org.:
- USDOE Office of Science (SC), Basic Energy Sciences (BES)
- OSTI Identifier:
- 1164146
- Grant/Contract Number:
- FG02-04ER46128
- Resource Type:
- Accepted Manuscript
- Journal Name:
- Optics Express
- Additional Journal Information:
- Journal Volume: 17; Journal Issue: 16; Journal ID: ISSN 1094-4087
- Publisher:
- Optical Society of America (OSA)
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; X-ray imaging; diffraction; image reconstruction techniques; noise in imaging systems
Citation Formats
Huang, Xiaojing, Miao, Huijie, Steinbrener, Jan, Nelson, Johanna, Shapiro, David, Stewart, Andrew, Turner, Joshua, and Jacobsen, Chris. Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy. United States: N. p., 2009.
Web. doi:10.1364/OE.17.013541.
Huang, Xiaojing, Miao, Huijie, Steinbrener, Jan, Nelson, Johanna, Shapiro, David, Stewart, Andrew, Turner, Joshua, & Jacobsen, Chris. Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy. United States. https://doi.org/10.1364/OE.17.013541
Huang, Xiaojing, Miao, Huijie, Steinbrener, Jan, Nelson, Johanna, Shapiro, David, Stewart, Andrew, Turner, Joshua, and Jacobsen, Chris. Thu .
"Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy". United States. https://doi.org/10.1364/OE.17.013541. https://www.osti.gov/servlets/purl/1164146.
@article{osti_1164146,
title = {Signal-to-noise and radiation exposure considerations in conventional and diffraction x-ray microscopy},
author = {Huang, Xiaojing and Miao, Huijie and Steinbrener, Jan and Nelson, Johanna and Shapiro, David and Stewart, Andrew and Turner, Joshua and Jacobsen, Chris},
abstractNote = {Using a signal-to-noise ratio estimation based on correlations between multiple simulated images, we compare the dose efficiency of two soft x-ray imaging systems: incoherent brightfield imaging using zone plate optics in a transmission x-ray microscope (TXM), and x-ray diffraction microscopy (XDM) where an image is reconstructed from the far-field coherent diffraction pattern. In XDM one must computationally phase weak diffraction signals; in TXM one suffers signal losses due to the finite numerical aperture and efficiency of the optics. In simulations with objects representing isolated cells such as yeast, we find that XDM has the potential for delivering equivalent resolution images using fewer photons. As a result, this can be an important advantage for studying radiation-sensitive biological and soft matter specimens.},
doi = {10.1364/OE.17.013541},
journal = {Optics Express},
number = 16,
volume = 17,
place = {United States},
year = {Thu Jan 01 00:00:00 EST 2009},
month = {Thu Jan 01 00:00:00 EST 2009}
}
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