On-Chip AC self-test controller
- Rhinebeck, NY
- Poughkeepsie, NY
- Fishkill, NY
A system for performing AC self-test on an integrated circuit that includes a system clock for normal operation is provided. The system includes the system clock, self-test circuitry, a first and second test register to capture and launch test data in response to a sequence of data pulses, and a logic circuit to be tested. The self-test circuitry includes an AC self-test controller and a clock splitter. The clock splitter generates the sequence of data pulses including a long data capture pulse followed by an at speed data launch pulse and an at speed data capture pulse followed by a long data launch pulse. The at speed data launch pulse and the at speed data capture pulse are generated for a common cycle of the system clock.
- Research Organization:
- Lawrence Livermore National Laboratory (LLNL), Livermore, CA (United States)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-48
- Assignee:
- International Business Machines Corporation (Armonk, NY)
- Patent Number(s):
- 7,596,734
- Application Number:
- 12/185,172
- OSTI ID:
- 988588
- Country of Publication:
- United States
- Language:
- English
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