skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Light scattering apparatus and method for determining radiation exposure to plastic detectors

Patent ·
OSTI ID:874862

An improved system and method of analyzing cumulative radiation exposure registered as pits on track etch foils of radiation dosimeters. The light scattering apparatus and method of the present invention increases the speed of analysis while it also provides the ability to analyze exposure levels beyond that which may be properly measured with conventional techniques. Dosimeters often contain small plastic sheets that register accumulated damage when exposed to a radiation source. When the plastic sheet from the dosimeter is chemically etched, a track etch foil is produced wherein pits or holes are created in the plastic. The number of these pits, or holes, per unit of area (pit density) correspond to the amount of cumulative radiation exposure which is being optically measured by the apparatus. To measure the cumulative radiation exposure of a track etch foil a high intensity collimated beam is passed through foil such that the pits and holes within the track etch foil cause a portion of the impinging light beam to become scattered upon exit. The scattered light is focused with a lens, while the primary collimated light beam (unscattered light) is blocked. The scattered light is focused by the lens onto an optical detector capable of registering the optical power of the scattered light which corresponds to the cumulative radiation to which the track etch foil has been exposed.

Research Organization:
Los Alamos National Laboratory (LANL), Los Alamos, NM (United States)
DOE Contract Number:
W-7405-ENG-36
Assignee:
The Regents of the University of California (Oakland, CA)
Patent Number(s):
US 6476910
OSTI ID:
874862
Country of Publication:
United States
Language:
English

References (4)

Technological Applications of Ion Tracks in Insulators journal December 1995
Ion Tracks in Solids: From Science to Technology to Diverse Applications journal December 1995
Fully automated image analysis of etched tracks in CR-39 journal September 1992
A New Method for Reading CR-39 by Using Coherent Light Scattering journal September 1999