X-ray diffraction properties and applications of layered synthetic microstructures in the 1 to 10 angstrom region
Layered synthetic microstructures have been built and tested for use as medium-resolution x-ray diffraction monochromators, in the 1 to 10 angstrom wavelength region. They can be employed to good advantage in spectrometry and imaging instruments that are used to determine the nature of the x-ray emission of high-temperature plasmas. When the micro-structures are used in spectrometers, we find that they gather much more light than natural crystals and are not troubled by high order diffraction response, yet have better spectral resolution than that provided by spectrometer channels formed by Ross filter or filter/fluorescer techniques. For use in imaging instruments such as the grazing-incidence reflection Kirkpatrick-Baez microscope, the microstructures provide high reflectivity at wavelengths shorter than the practical limit of total external reflection. We will present calibration data that describes the diffraction properties and piece-to-piece uniformity of microstructures built especially for use in the 1 to 10 angstrom region. We will also describe in detail two instruments that will be used at the Shiva laser system to determine the spectral and spatial distributions of x-rays radiated by inertial confinement fusion targets.
- Research Organization:
- Lawrence Livermore National Lab., CA (USA); Stanford Univ., CA (USA). Center for Materials Research
- DOE Contract Number:
- W-7405-ENG-48
- OSTI ID:
- 6450894
- Report Number(s):
- UCRL-84297; CONF-8008100-1; TRN: 81-009072
- Resource Relation:
- Conference: International conference on x-ray processes and inner shell ionization, Glasgow, UK, 25 Aug 1980
- Country of Publication:
- United States
- Language:
- English
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