Toyota beamline (BL33XU) at SPring-8
- Toyota Central R&D Labs., Inc., 41-1 Nagakute Aichi 480-1192 Japan (Japan)
- Diamond Light Source, Harwell Science and Innovation Campus, Didcot, Oxfordshire OX11 0DE UK (United Kingdom)
- RIKEN Harima Institute 1-1-1 Koto Sayo, Hyogo 679-5148 (Japan)
- JASRI/SPring-8 1-1-1 Koto Sayo, Hyogo 679-5148 (Japan)
The Toyota beamline (BL33XU) at SPring-8 is an undulator beamline developed to assist in the study of various automotive-related materials. The light source is a tapered in-vacuum undulator that provides a variable energy band width as well as a high brilliance X-ray beam. Two different optical arrangements are available: Optics 1 and Optics 2. Optics 1 is dedicated to time-resolved X-ray absorption spectroscopy (XAFS), and consists of two channel-cut crystal monochromators and four water-cooled flat Si mirrors. The Si(111) and Si(220) monochromator crystals cover an energy range of 4.0–46.0 keV and are driven by high-speed AC servo motors. These monochromators, in conjunction with the tapered undulator, enable high-quality XAFS data acquisition with a temporal resolution of 10 ms. Optics 2 is optimized for X-ray diffraction, scattering and imaging and includes a recently installed double crystal monochromator, two water-cooled flat Si mirrors and Kirkpatrick-Baez (KB) focusing mirrors. The monochromator incorporates parallel mounted Si(111) and Si(311) crystals and covers an energy range of 4.5–70 keV. The beamline provides two experimental stations: Exp. Hutch 2 and Exp. Hutch 3. The gas supply system and mass spectrometers installed in Exp. Hutch 2 allow in-operando measurements under various atmospheres. The scanning three-dimensional X-ray diffraction (scanning 3DXRD) microscopy instrumentation developed and installed in Exp. Hutch 3 enables non-destructive orientation and stress mapping of 1 mm-thick steel specimens using a high energy microbeam.
- OSTI ID:
- 22608379
- Journal Information:
- AIP Conference Proceedings, Vol. 1741, Issue 1; Conference: SRI2015: 12. international conference on synchrotron radiation instrumentation, New York, NY (United States), 6-10 Jul 2015; Other Information: (c) 2016 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ABSORPTION
ABSORPTION SPECTROSCOPY
BEAM OPTICS
CRYSTALS
DATA ACQUISITION
FINE STRUCTURE
KEV RANGE
MASS SPECTROMETERS
MICROSCOPY
MIRRORS
MONOCHROMATORS
SILICON
SPRING-8 STORAGE RING
STRESSES
THREE-DIMENSIONAL CALCULATIONS
TIME RESOLUTION
WIGGLER MAGNETS
X-RAY DIFFRACTION
X-RAY SPECTROSCOPY