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Title: A prototype ionization profile monitor for RHIC

Conference ·
OSTI ID:493360

Transverse beam profiles in the Relativistic Heavy-Ion Collider (RHIC) will be measured with ionization profile monitors (IPM`s). Each IPM collects and measures the distribution of electrons in the beamline resulting from residual gas ionization during bunch passage. The electrons are swept transversely from the beamline and collected on strip anodes oriented parallel to the beam axis. At each bunch passage the charge pulses are amplified, integrated, and digitized for display as a profile histogram. A prototype detector was tested in the injection line during the RHIC Sextant Test. This paper describes the detector and gives results from the beam tests.

Research Organization:
Brookhaven National Lab. (BNL), Upton, NY (United States)
Sponsoring Organization:
USDOE Office of Energy Research, Washington, DC (United States)
DOE Contract Number:
AC02-76CH00016
OSTI ID:
493360
Report Number(s):
BNL-64356; CONF-970503-95; ON: DE97006671; TRN: 97:013237
Resource Relation:
Conference: 17. IEEE particle accelerator conference, Vancouver (Canada), 12-16 May 1997; Other Information: PBD: 1997
Country of Publication:
United States
Language:
English

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