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Title: Superconductivity Behavior in Epitaxial TiN Films Points to Surface Magnetic Disorder

Journal Article · · Physical Review Applied
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  1. Moscow State University of Education (Russia)
  2. Moscow State University of Education (Russia); National Research University Higher School of Economics, Moscow (Russia)
  3. National Research University MPEI, Moscow (Russia)
  4. Purdue Univ., West Lafayette, IN (United States)
  5. Moscow State University of Education (Russia); National Research University Higher School of Economics, Moscow (Russia); Institute of Solid State Physics, Chernogolovka (Russia)

In this work we analyze the evolution of the normal and superconducting properties of epitaxial TiN films, characterized by high Ioffe-Regel parameter values, as a function of the film thickness. As the film thickness decreases, we observe an increase of the residual resistivity, that becomes dominated by diffusive surface scattering for d ≤ 20 nm . At the same time, a substantial thickness-dependent reduction of the superconducting critical temperature is observed compared to the bulk TiN value. In such high-quality material films, this effect can be explained by a weak magnetic disorder residing in the surface layer with a characteristic magnetic defect density of approximately 1012 cm–2. Our results suggest that surface magnetic disorder is generally present in oxidized TiN films.

Research Organization:
Purdue Univ., West Lafayette, IN (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES). Materials Sciences & Engineering Division; Russian Science Foundation (RSF); Russian Foundation for Basic Research (RFBR)
Grant/Contract Number:
SC0017717; MK-1308.2019.2
OSTI ID:
1803145
Journal Information:
Physical Review Applied, Vol. 12, Issue 5; ISSN 2331-7019
Publisher:
American Physical Society (APS)Copyright Statement
Country of Publication:
United States
Language:
English

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