Isotope-Resolved Electron Energy Loss Spectroscopy in a Monochromated Scanning Transmission Electron Microscope

Hachtel, Jordan A.; Jokisaari, Jacob R.; Krivanek, Ondrej L.; Idrobo Tapia, Juan Carlos; Klie, Robert F.

doi:10.1017/s1551929520001789

Title: Isotope-Resolved Electron Energy Loss Spectroscopy in a Monochromated Scanning Transmission Electron Microscope

Journal Article · Fri Jan 15 00:00:00 EST 2021 · Microscopy Today

DOI:https://doi.org/10.1017/s1551929520001789· OSTI ID:1767869

^[1]; Jokisaari, Jacob R. ^[2]; Krivanek, Ondrej L. ^[3];

^[1]; Klie, Robert F. ^[2]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Univ. of Illinois, Chicago, IL (United States)
Nion Co., Kirkland, WA (United States)

The development and implementation of high-stability monochromators in state-of-the-art aberration-corrected scanning transmission electron microscopes has enabled materials characterization with an energy resolution as good as 3 meV. This allows the vibrational modes, which would otherwise be obscured by the energy spread of the electron beam, to be probed with very high precision in molecular materials. Since the vibrational energies depend on the weight of the atomic nuclei, vibrational spectroscopy can distinguish isotopes whose only difference lies in their neutron content. This opens up isotopic analysis and mapping in transmission electron microscopy as two important new research areas. In this paper, we review the monochromated electron energy loss spectroscopy (EELS) instrumentation, discuss optimal methods for probing beam-sensitive materials without destroying them, and review key nanoscale isotope-resolved results.

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Research Organization:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1767869

Journal Information:: Microscopy Today, Vol. 29, Issue 1; ISSN 1551-9295

Publisher:: Cambridge University PressCopyright Statement

Country of Publication:: United States

Language:: English

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