Materials Characterization in the Aberration-Corrected Scanning Transmission Electron Microscope
- ORNL
- University of Tokyo, Tokyo, Japan
In the nanoscience era, the properties of many exciting new materials and devices will depend on the details of their composition down to the level of single atoms. Thus the characterization of the structure and electronic properties of matter at the atomic scale is becoming ever more vital for economic and technological as well as for scientific reasons. The combination of atomic-resolution Z-contrast scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS) represents a powerful method to link the atomic and electronic structure to macroscopic properties, allowing materials, nanoscale systems, and interfaces to be probed in unprecedented detail. Z-contrast STEM uses electrons that have been scattered to large angles for imaging. The relative intensity of each atomic column is roughly proportional to Z{sup 2}, where Z is the atomic number. Recent developments in correcting the aberrations of the lenses in the electron microscope have pushed the achievable spatial resolution and the sensitivity for imaging and spectroscopy in the STEM into the sub-Angstrom (sub-{angstrom}) regime, providing a new level of insight into the structure/property relations of complex materials. Images acquired with an aberration-corrected instrument show greatly improved contrast. The signal-to-noise ratio is sufficiently high to allow sensitivity even to single atoms in both imaging and spectroscopy. This is a key achievement because the detection and measurement of the response of individual atoms has become a challenging issue to provide new insight into many fields, such as catalysis, ceramic materials, complex oxide interfaces, or grain boundaries. In this article, the state-of-the-art for the characterization of all of these different types of materials by means of aberration-corrected STEM and EELS are reviewed.
- Research Organization:
- Oak Ridge National Laboratory (ORNL)
- Sponsoring Organization:
- SC USDOE - Office of Science (SC)
- DOE Contract Number:
- AC05-00OR22725
- OSTI ID:
- 1003155
- Journal Information:
- Annual Review of Materials Research, Journal Name: Annual Review of Materials Research Journal Issue: 1 Vol. 35; ISSN 1545-4118; ISSN 1531-7331
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
ATOMIC NUMBER
ATOMS
CATALYSIS
CERAMICS
ELECTRON MICROSCOPES
ELECTRONIC STRUCTURE
ELECTRONS
ENERGY-LOSS SPECTROSCOPY
EQUIPMENT
GRAIN BOUNDARIES
IMAGES
INTERFACES
LENSES
MATERIALS
OXIDES
SIGNAL-TO-NOISE RATIO
SPATIAL RESOLUTION
SPECTROSCOPY
TRANSMISSION
TRANSMISSION ELECTRON MICROSCOPY