Atomic-resolution EELS for composition and 3-D coordination determination at interfaces and defects
- Univ. of Illinois, Chicago, IL (United States); and others
Materials properties associated with interfaces and defects are dominated by atomic scale fluctuations in composition, structure and bonding. Although electron energy loss spectroscopy (EELS) provides a powerful tool to probe these features, low signal, lens aberrations, image coherence and specimen drift preclude the use of spectrum imaging and energy filtered imaging for these high-resolution problems. However, by utilizing Z-contrast imaging in conjunction with EELS in the scanning transmission electron microscope (STEM), these limitations are largely overcome and EELS appears capable of providing fundamental 3-D characterization of defect and interface structures with atomic resolution and sensitivity.
- OSTI ID:
- 468863
- Report Number(s):
- CONF-960877--
- Country of Publication:
- United States
- Language:
- English
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