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Title: Sample analysis systems and methods of use thereof

Patent ·
OSTI ID:1735056
; ;

The invention generally relates to sample analysis systems and methods of use thereof. In certain aspects, the invention provides a system for analyzing a sample that includes an ion generator configured to generate ions from a sample. The system additionally includes an ion separator configured to separate at or above atmospheric pressure the ions received from the ion generator without use of laminar flowing gas, and a detector that receives and detects the separated ions.

Research Organization:
Purdue Univ., West Lafayette, IN (United States)
Sponsoring Organization:
USDOE
DOE Contract Number:
FG02-06ER15807
Assignee:
Purdue Research Foundation (West Lafayette, IN)
Patent Number(s):
10,720,316
Application Number:
16/103,436
OSTI ID:
1735056
Resource Relation:
Patent File Date: 08/14/2018
Country of Publication:
United States
Language:
English

References (23)

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Apparatus and method for MSnth in a tandem mass spectrometer system patent December 2006
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System and method for the preparation of arrays of biological or other molecules patent April 2008
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System and Method for the Preparation of Arrays of Biological or Other Molecules patent-application December 2003
Ion generation using wetted porous material patent October 2014
Coupling Differential Mobility Based Ambient Pressure Ion Prefiltering and Ion Focusing at Low Flow Rates for a Portable Mass Spectrometer patent-application May 2011
Low Temperature Plasma Probe and Methods of Use Thereof patent-application February 2011
Ion Mobility Spectrometer patent-application January 2011
Ion Detecting Apparatus patent-application December 2014

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