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Title: Beam-Based Defect Localization in ICs.

Conference ·
OSTI ID:1716647

Abstract not provided.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
DOE Contract Number:
AC04-94AL85000
OSTI ID:
1716647
Report Number(s):
SAND2007-6572P; 520684
Resource Relation:
Conference: Proposed for presentation at the 2007 IEEE International Integrated Reliability Workshop held November 15-18, 2007 in S. Lake Tahoe, CA.
Country of Publication:
United States
Language:
English

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