Kelvin probe force microscopy for characterization of semiconductor devices and processes
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journal
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March 1996 |
Intermodulation atomic force microscopy
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journal
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April 2008 |
Space- and Time-Resolved Mapping of Ionic Dynamic and Electroresistive Phenomena in Lateral Devices
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journal
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July 2013 |
A detailed analysis of the optical beam deflection technique for use in atomic force microscopy
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July 1992 |
Dynamic atomic force microscopy methods
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September 2002 |
Single Molecule Force Spectroscopy on Polysaccharides by Atomic Force Microscopy
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February 1997 |
Multivariate statistical methods for the analysis of microscope image series: applications in materials science
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April 1998 |
Magnetic imaging by ‘‘force microscopy’’ with 1000 Å resolution
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May 1987 |
Time-resolved electrostatic force microscopy of polymer solar cells
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journal
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August 2006 |
Coherent branched flow in a two-dimensional electron gas
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journal
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March 2001 |
Big, Deep, and Smart Data in Scanning Probe Microscopy
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journal
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September 2016 |
Imaging the charge distribution within a single molecule
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journal
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February 2012 |
Dual harmonic Kelvin probe force microscopy at the graphene–liquid interface
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journal
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March 2014 |
Adaptive Markov Random Fields for Joint Unmixing and Segmentation of Hyperspectral Images
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journal
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January 2013 |
7 × 7 Reconstruction on Si(111) Resolved in Real Space
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January 1983 |
Dual-frequency resonance-tracking atomic force microscopy
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October 2007 |
Tip-induced band bending and its effect on local barrier height measurement studied by light-modulated scanning tunneling spectroscopy
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January 2006 |
Detection and localization of single molecular recognition events using atomic force microscopy
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April 2006 |
Kelvin probe force microscopy
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June 1991 |
Mapping of conservative and dissipative interactions in bimodal atomic force microscopy using open-loop and phase-locked-loop control of the higher eigenmode
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August 2011 |
Local potential and polarization screening on ferroelectric surfaces
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journal
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March 2001 |
Force spectroscopy with single bio-molecules
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journal
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October 2000 |
A decade of piezoresponse force microscopy: progress, challenges, and opportunities
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journal
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December 2006 |
State-space model of freely vibrating and surface-coupled cantilever dynamics in atomic force microscopy
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journal
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February 2004 |
Atomic Resolution with Atomic Force Microscope
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June 1987 |
Frequency response of higher cantilever eigenmodes in bimodal and trimodal tapping mode atomic force microscopy
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November 2010 |
Spatially localized dynamic properties of individual interfaces in semiconducting oxides
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journal
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February 2000 |
Imaging and Control of Domain Structures in Ferroelectric thin Films via Scanning Force Microscopy
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journal
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August 1998 |
Single-molecule recognition imaging microscopy
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journal
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August 2004 |
The emergence of multifrequency force microscopy
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journal
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April 2012 |
Atomic Resolution of the Silicon (111)-(7x7) Surface by Atomic Force Microscopy
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journal
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January 1995 |
Compositional mapping of surfaces in atomic force microscopy by excitation of the second normal mode of the microcantilever
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journal
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January 2004 |
Spectral mixture analysis of EELS spectrum-images
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journal
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September 2012 |
Optical‐beam‐deflection atomic force microscopy: The NaCl (001) surface
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journal
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May 1990 |
Scanning force microscopy of domain structure in ferroelectric thin films: imaging and control
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journal
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September 1997 |
Using molecular dynamics to quantify the electrical double layer and examine the potential for its direct observation in the in-situ TEM
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March 2015 |
Reconstruction of tip-surface interactions with multimodal intermodulation atomic force microscopy
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journal
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September 2013 |
Observation of $\bf 7\times 7$ Reconstructed Structure on the Silicon (111) Surface using Ultrahigh Vacuum Noncontact Atomic Force Microscopy
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journal
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January 1995 |
Atomic force microscopy-based experimental setup for studying domain switching dynamics in ferroelectric capacitors
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journal
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February 2005 |
Instrumental Community: Probe Microscopy and the Path to Nanotechnology
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book
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January 2011 |
The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale
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journal
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September 2007 |
Open loop Kelvin probe force microscopy with single and multi-frequency excitation
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journal
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October 2013 |
Phase imaging with intermodulation atomic force microscopy
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May 2010 |
Band excitation in scanning probe microscopy: sines of change
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journal
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November 2011 |
How the doors to the nanoworld were opened
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October 2006 |
Atomic resolution imaging of a nonconductor by atomic force microscopy
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October 1987 |
The role of nonlinear dynamics in quantitative atomic force microscopy
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June 2012 |
Kelvin probe force microscopy in liquid using electrochemical force microscopy
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January 2015 |
G-mode magnetic force microscopy: Separating magnetic and electrostatic interactions using big data analytics
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journal
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May 2016 |
Analytical approach to the local contact potential difference on (001) ionic surfaces: Implications for Kelvin probe force microscopy
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journal
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July 2008 |
Note: The intermodulation lockin analyzer
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journal
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February 2011 |
AFM's path to atomic resolution
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journal
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May 2005 |
Rapid mapping of polarization switching through complete information acquisition
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journal
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December 2016 |
Magnetic dissipation force microscopy
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journal
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July 1997 |
Full information acquisition in piezoresponse force microscopy
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journal
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December 2015 |
Bimodal atomic force microscopy imaging of isolated antibodies in air and liquids
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journal
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August 2008 |
Piezoresponse Force Microscopy: A Window into Electromechanical Behavior at the Nanoscale
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journal
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September 2009 |
Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopy
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journal
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February 2016 |
Local polarization dynamics in ferroelectric materials
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journal
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April 2010 |
Electromechanical Imaging and Spectroscopy of Ferroelectric and Piezoelectric Materials: State of the Art and Prospects for the Future
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journal
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August 2009 |
Band excitation Kelvin probe force microscopy utilizing photothermal excitation
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journal
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March 2015 |
True atomic resolution in liquid by frequency-modulation atomic force microscopy
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journal
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July 2005 |
Spectroscopic imaging in piezoresponse force microscopy: New opportunities for studying polarization dynamics in ferroelectrics and multiferroics
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journal
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July 2012 |
BEAM: A Computational Workflow System for Managing and Modeling Material Characterization Data in HPC Environments
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journal
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January 2016 |
Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy
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journal
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June 2009 |
The elimination of the ‘artifact’ in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope
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journal
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March 2002 |
Accuracy and resolution limits of Kelvin probe force microscopy
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journal
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March 2005 |
Electromechanics on the Nanometer Scale: Emerging Phenomena, Devices, and Applications
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journal
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September 2009 |
Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space
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journal
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August 2016 |
Model-based extraction of material properties in multifrequency atomic force microscopy
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journal
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May 2012 |
Ferroelectric domain switching dynamics with combined 20 nm and 10 ns resolution
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journal
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October 2009 |
Unsupervised Unmixing of Hyperspectral Images Accounting for Endmember Variability
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journal
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December 2015 |
An atomic force microscope tip designed to measure time-varying nanomechanical forces
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journal
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July 2007 |
KPFM imaging of Si(1 1 1)-Sb surface for atom distinction using NC-AFM
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journal
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March 2003 |
Imaging via complete cantilever dynamic detection: general dynamic mode imaging and spectroscopy in scanning probe microscopy
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September 2016 |
Role of 90° domains in lead zirconate titanate thin films
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journal
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July 2000 |
Nonlinear Spectral Unmixing of Hyperspectral Images Using Gaussian Processes
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May 2013 |