Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space

Balke, Nina; Kalinin, Sergei V.; Jesse, Stephen; Collins, Liam; Belianinov, Alex; Somnath, Suhas

doi:10.1038/srep30557

Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space

Journal Article · Fri Aug 12 00:00:00 EDT 2016 · Scientific Reports

DOI:https://doi.org/10.1038/srep30557· OSTI ID:1295108

Balke, Nina ^[1]; Kalinin, Sergei V. ^[1]; Jesse, Stephen ^[1]; Collins, Liam ^[1]; Belianinov, Alex ^[1]; Somnath, Suhas ^[1]

Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)

Kelvin probe force microscopy (KPFM) has provided deep insights into the role local electronic, ionic and electrochemical processes play on the global functionality of materials and devices, even down to the atomic scale. Conventional KPFM utilizes heterodyne detection and bias feedback to measure the contact potential difference (CPD) between tip and sample. This measurement paradigm, however, permits only partial recovery of the information encoded in bias- and time-dependent electrostatic interactions between the tip and sample and effectively down-samples the cantilever response to a single measurement of CPD per pixel. This level of detail is insufficient for electroactive materials, devices, or solid-liquid interfaces, where non-linear dielectrics are present or spurious electrostatic events are possible. Here, we simulate and experimentally validate a novel approach for spatially resolved KPFM capable of a full information transfer of the dynamic electric processes occurring between tip and sample. General acquisition mode, or G-Mode, adopts a big data approach utilising high speed detection, compression, and storage of the raw cantilever deflection signal in its entirety at high sampling rates (> 4 MHz), providing a permanent record of the tip trajectory. We develop a range of methodologies for analysing the resultant large multidimensional datasets involving classical, physics-based and information-based approaches. Physics-based analysis of G-Mode KPFM data recovers the parabolic bias dependence of the electrostatic force for each cycle of the excitation voltage, leading to a multidimensional dataset containing spatial and temporal dependence of the CPD and capacitance channels. We use multivariate statistical methods to reduce data volume and separate the complex multidimensional data sets into statistically significant components that can then be mapped onto separate physical mechanisms. Overall, G-Mode KPFM offers a new paradigm to study dynamic electric phenomena in electroactive interfaces as well as offer a promising approach to extend KPFM to solid-liquid interfaces.

View Accepted Manuscript (DOE)

Research Organization:: Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1295108

Journal Information:: Scientific Reports, Journal Name: Scientific Reports Vol. 6; ISSN 2045-2322

Publisher:: Nature Publishing GroupCopyright Statement

Country of Publication:: United States

Language:: English

References (54)

Nanoscale Measurement of the Dielectric Constant of Supported Lipid Bilayers in Aqueous Solutions with Electrostatic Force Microscopy Gramse, G.; Dols-Perez, A.; Edwards, M. A. Biophysical Journal, Vol. 104, Issue 6 https://doi.org/10.1016/j.bpj.2013.02.011	journal	March 2013
Constraining Data Mining with Physical Models: Voltage- and Oxygen Pressure-Dependent Transport in Multiferroic Nanostructures Strelcov, Evgheni; Belianinov, Alexei; Hsieh, Ying-Hui Nano Letters, Vol. 15, Issue 10 https://doi.org/10.1021/acs.nanolett.5b02472	journal	August 2015
Morphology-Dependent Trap Formation in Bulk Heterojunction Photodiodes Shao, Guozheng; Rayermann, Glennis E.; Smith, Eric M. The Journal of Physical Chemistry B, Vol. 117, Issue 16 https://doi.org/10.1021/jp3090843	journal	November 2012
Submicrosecond Time Resolution Atomic Force Microscopy for Probing Nanoscale Dynamics Giridharagopal, Rajiv; Rayermann, Glennis E.; Shao, Guozheng Nano Letters, Vol. 12, Issue 2 https://doi.org/10.1021/nl203956q	journal	January 2012
Probing Local Ionic Dynamics in Functional Oxides at the Nanoscale Strelcov, Evgheni; Kim, Yunseok; Jesse, Stephen Nano Letters, Vol. 13, Issue 8 https://doi.org/10.1021/nl400780d	journal	July 2013
Revealing Energy Level Structure of Individual Quantum Dots by Tunneling Rate Measured by Single-Electron Sensitive Electrostatic Force Spectroscopy Roy-Gobeil, Antoine; Miyahara, Yoichi; Grutter, Peter Nano Letters, Vol. 15, Issue 4 https://doi.org/10.1021/nl504468a	journal	March 2015
Space- and Time-Resolved Mapping of Ionic Dynamic and Electroresistive Phenomena in Lateral Devices Strelcov, Evgheni; Jesse, Stephen; Huang, Yen-Lin ACS Nano, Vol. 7, Issue 8 https://doi.org/10.1021/nn4017873	journal	July 2013
Deep Data Analysis of Conductive Phenomena on Complex Oxide Interfaces: Physics from Data Mining Strelcov, Evgheni; Belianinov, Alexei; Hsieh, Ying-Hui ACS Nano, Vol. 8, Issue 6 https://doi.org/10.1021/nn502029b	journal	May 2014
Full information acquisition in piezoresponse force microscopy Somnath, Suhas; Belianinov, Alexei; Kalinin, Sergei V. Applied Physics Letters, Vol. 107, Issue 26 https://doi.org/10.1063/1.4938482	journal	December 2015
Fast time-resolved electrostatic force microscopy: Achieving sub-cycle time resolution Karatay, Durmus U.; Harrison, Jeffrey S.; Glaz, Micah S. Review of Scientific Instruments, Vol. 87, Issue 5 https://doi.org/10.1063/1.4948396	journal	May 2016
Intermittent contact mode piezoresponse force microscopy in a liquid environment Rodriguez, Brian J.; Jesse, Stephen; Habelitz, Stefan Nanotechnology, Vol. 20, Issue 19 https://doi.org/10.1088/0957-4484/20/19/195701	journal	April 2009
Principal component and spatial correlation analysis of spectroscopic-imaging data in scanning probe microscopy Jesse, Stephen; Kalinin, Sergei V. Nanotechnology, Vol. 20, Issue 8 https://doi.org/10.1088/0957-4484/20/8/085714	journal	February 2009
Open loop Kelvin probe force microscopy with single and multi-frequency excitation Collins, L.; Kilpatrick, J. I.; Weber, S. A. L. Nanotechnology, Vol. 24, Issue 47 https://doi.org/10.1088/0957-4484/24/47/475702	journal	October 2013
Quantitative 3D-KPFM imaging with simultaneous electrostatic force and force gradient detection Collins, L.; Okatan, M. B.; Li, Q. Nanotechnology, Vol. 26, Issue 17 https://doi.org/10.1088/0957-4484/26/17/175707	journal	April 2015
Kelvin probe force microscopy for characterization of semiconductor devices and processes Tanimoto, Masafumi Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, Vol. 14, Issue 2 https://doi.org/10.1116/1.589136	journal	March 1996
Erratum: Big data and deep data in scanning and electron microscopies: deriving functionality from multidimensional data sets Belianinov, Alex; Vasudevan, Rama; Strelcov, Evgheni Advanced Structural and Chemical Imaging, Vol. 1, Issue 1 https://doi.org/10.1186/s40679-015-0011-9	journal	August 2015
Kelvin probe force microscopy in liquid using electrochemical force microscopy Collins, Liam; Jesse, Stephen; Kilpatrick, Jason I. Beilstein Journal of Nanotechnology, Vol. 6 https://doi.org/10.3762/bjnano.6.19	journal	January 2015
Direct Probing of Charge Injection and Polarization-Controlled Ionic Mobility on Ferroelectric LiNbO ₃ Surfaces Strelcov, Evgheni; Ievlev, Anton V.; Jesse, Stephen Advanced Materials, Vol. 26, Issue 6 https://doi.org/10.1002/adma.201304002	journal	November 2013
Kelvin Probe Force Microscopy Sadewasser, Sascha; Glatzel, Thilo Springer Series in Surface Sciences https://doi.org/10.1007/978-3-319-75687-5	book	March 2018
Kelvin Probe Force Microscopy Sadewasser, Sascha; Glatzel, Thilo Springer Series in Surface Sciences https://doi.org/10.1007/978-3-642-22566-6	book	January 2012
The elimination of the ‘artifact’ in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope Okamoto, Kenji; Sugawara, Yasuhiro; Morita, Seizo Applied Surface Science, Vol. 188, Issue 3-4 https://doi.org/10.1016/S0169-4332(01)00953-9	journal	March 2002
KPFM imaging of Si(1 1 1)-Sb surface for atom distinction using NC-AFM Okamoto, Kenji; Yoshimoto, Kentaro; Sugawara, Yasuhiro Applied Surface Science, Vol. 210, Issue 1-2 https://doi.org/10.1016/S0169-4332(02)01492-7	journal	March 2003
Kelvin force microscopy at the second cantilever resonance: An out-of-vacuum crosstalk compensation setup Diesinger, H.; Deresmes, D.; Nys, J. -P. Ultramicroscopy, Vol. 108, Issue 8 https://doi.org/10.1016/j.ultramic.2008.01.003	journal	July 2008
Periodic Charging of Individual Molecules Coupled to the Motion of an Atomic Force Microscopy Tip Kocić, N.; Weiderer, P.; Keller, S. Nano Letters, Vol. 15, Issue 7 https://doi.org/10.1021/acs.nanolett.5b00711	journal	June 2015
Imaging Local Trap Formation in Conjugated Polymer Solar Cells: A Comparison of Time-Resolved Electrostatic Force Microscopy and Scanning Kelvin Probe Imaging Reid, Obadiah G.; Rayermann, Glennis E.; Coffey, David C. The Journal of Physical Chemistry C, Vol. 114, Issue 48 https://doi.org/10.1021/jp1056607	journal	October 2010
Kelvin Probe Force Microscopy of Periodic Ferroelectric Domain Structure in KTiOPO ₄ Crystals Shvebelman, Maria M.; Agronin, Alex G.; Urenski, Ronen P. Nano Letters, Vol. 2, Issue 5 https://doi.org/10.1021/nl025523e	journal	May 2002
Complete information acquisition in dynamic force microscopy Belianinov, Alexei; Kalinin, Sergei V.; Jesse, Stephen Nature Communications, Vol. 6, Issue 1 https://doi.org/10.1038/ncomms7550	journal	March 2015
Time-resolved electrostatic force microscopy of polymer solar cells Coffey, David C.; Ginger, David S. Nature Materials, Vol. 5, Issue 9 https://doi.org/10.1038/nmat1712	journal	August 2006
Label-free identification of single dielectric nanoparticles and viruses with ultraweak polarization forces Fumagalli, Laura; Esteban-Ferrer, Daniel; Cuervo, Ana Nature Materials, Vol. 11, Issue 9 https://doi.org/10.1038/nmat3369	journal	July 2012
Imaging the charge distribution within a single molecule Mohn, Fabian; Gross, Leo; Moll, Nikolaj Nature Nanotechnology, Vol. 7, Issue 4 https://doi.org/10.1038/nnano.2012.20	journal	February 2012
Kelvin probe force microscopy Nonnenmacher, M.; O’Boyle, M. P.; Wickramasinghe, H. K. Applied Physics Letters, Vol. 58, Issue 25 https://doi.org/10.1063/1.105227	journal	June 1991
Practical aspects of Kelvin probe force microscopy Jacobs, H. O.; Knapp, H. F.; Stemmer, A. Review of Scientific Instruments, Vol. 70, Issue 3 https://doi.org/10.1063/1.1149664	journal	March 1999
Spatially localized dynamic properties of individual interfaces in semiconducting oxides Huey, Bryan D.; Bonnell, Dawn A. Applied Physics Letters, Vol. 76, Issue 8 https://doi.org/10.1063/1.125923	journal	February 2000
Scanning impedance microscopy of an active Schottky barrier diode Kalinin, Sergei V.; Bonnell, Dawn A. Journal of Applied Physics, Vol. 91, Issue 2 https://doi.org/10.1063/1.1427145	journal	January 2002
Nonlinear transport imaging by scanning impedance microscopy Shin, J.; Meunier, V.; Baddorf, A. P. Applied Physics Letters, Vol. 85, Issue 18 https://doi.org/10.1063/1.1812372	journal	November 2004
Scanning frequency mixing microscopy of high-frequency transport behavior at electroactive interfaces Rodriguez, Brian J.; Jesse, Stephen; Meunier, Vincent Applied Physics Letters, Vol. 88, Issue 14 https://doi.org/10.1063/1.2192977	journal	April 2006
Improved Kelvin probe force microscopy for imaging individual DNA molecules on insulating surfaces Leung, Carl; Maradan, Dario; Kramer, Armin Applied Physics Letters, Vol. 97, Issue 20 https://doi.org/10.1063/1.3512867	journal	November 2010
Note: Quantitative (artifact-free) surface potential measurements using Kelvin force microscopy Mélin, T.; Barbet, S.; Diesinger, H. Review of Scientific Instruments, Vol. 82, Issue 3 https://doi.org/10.1063/1.3516046	journal	March 2011
Quantitative potential measurements of nanoparticles with different surface charges in liquid by open-loop electric potential microscopy Kobayashi, Naritaka; Asakawa, Hitoshi; Fukuma, Takeshi Journal of Applied Physics, Vol. 110, Issue 4 https://doi.org/10.1063/1.3625230	journal	August 2011
Effect of phase transition on the surface potential of the BaTiO3 (100) surface by variable temperature scanning surface potential microscopy Kalinin, Sergei V.; Bonnell, Dawn A. Journal of Applied Physics, Vol. 87, Issue 8 https://doi.org/10.1063/1.372440	journal	April 2000
Dynamic electrostatic force microscopy in liquid media Gramse, G.; Edwards, M. A.; Fumagalli, L. Applied Physics Letters, Vol. 101, Issue 21 https://doi.org/10.1063/1.4768164	journal	November 2012
Dual harmonic Kelvin probe force microscopy at the graphene–liquid interface Collins, Liam; Kilpatrick, Jason I.; Vlassiouk, Ivan V. Applied Physics Letters, Vol. 104, Issue 13 https://doi.org/10.1063/1.4870074	journal	March 2014
Pump-probe Kelvin-probe force microscopy: Principle of operation and resolution limits Murawski, J.; Graupner, T.; Milde, P. Journal of Applied Physics, Vol. 118, Issue 15 https://doi.org/10.1063/1.4933289	journal	October 2015
Tracking speed bumps in organic field-effect transistors via pump-probe Kelvin-probe force microscopy Murawski, J.; Mönch, T.; Milde, P. Journal of Applied Physics, Vol. 118, Issue 24 https://doi.org/10.1063/1.4938529	journal	December 2015
G-mode magnetic force microscopy: Separating magnetic and electrostatic interactions using big data analytics Collins, Liam; Belianinov, Alex; Proksch, Roger Applied Physics Letters, Vol. 108, Issue 19 https://doi.org/10.1063/1.4948601	journal	May 2016
Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopy Collins, Liam; Belianinov, Alex; Somnath, Suhas Nanotechnology, Vol. 27, Issue 10 https://doi.org/10.1088/0957-4484/27/10/105706	journal	February 2016
Local potential and polarization screening on ferroelectric surfaces Kalinin, Sergei V.; Bonnell, Dawn A. Physical Review B, Vol. 63, Issue 12 https://doi.org/10.1103/PhysRevB.63.125411	journal	March 2001
Local electronic transport at grain boundaries in Nb-doped Sr Ti O 3 Kalinin, Sergei V.; Bonnell, Dawn A. Physical Review B, Vol. 70, Issue 23 https://doi.org/10.1103/PhysRevB.70.235304	journal	December 2004
New Insights on Atomic-Resolution Frequency-Modulation Kelvin-Probe Force-Microscopy Imaging of Semiconductors Sadewasser, Sascha; Jelinek, Pavel; Fang, Chung-Kai Physical Review Letters, Vol. 103, Issue 26 https://doi.org/10.1103/PhysRevLett.103.266103	journal	December 2009
Atomic Force Microscope Binnig, G.; Quate, C. F.; Gerber, Ch. Physical Review Letters, Vol. 56, Issue 9 https://doi.org/10.1103/PhysRevLett.56.930	journal	March 1986
Detection of Single-Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic-Force Microscopy Stomp, Romain; Miyahara, Yoichi; Schaer, Sacha Physical Review Letters, Vol. 94, Issue 5 https://doi.org/10.1103/PhysRevLett.94.056802	journal	February 2005
Using molecular dynamics to quantify the electrical double layer and examine the potential for its direct observation in the in-situ TEM Welch, David A.; Mehdi, B. Layla; Hatchell, Hannah J. Advanced Structural and Chemical Imaging, Vol. 1, Issue 1 https://doi.org/10.1186/s40679-014-0002-2	journal	March 2015
Atomic Force Microscope. [原子間力顕微鏡] Tsuda, Nobuhiro Journal of the Japan Society for Precision Engineering, Vol. 57, Issue 7 https://doi.org/10.2493/jjspe.57.1159	journal	January 1991
Detection of Single Electron Charging in an Individual InAs Quantum Dot by Noncontact Atomic Force Microscopy Stomp, Romain; Miyahara, Yoichi; Schaer, Sacha arXiv https://doi.org/10.48550/arxiv.cond-mat/0501272	text	January 2005

Cited By (16)

Rapid mapping of polarization switching through complete information acquisition Somnath, Suhas; Belianinov, Alex; Kalinin, Sergei V. Nature Communications, Vol. 7, Issue 1 https://doi.org/10.1038/ncomms13290	journal	December 2016
Ultrafast current imaging by Bayesian inversion Somnath, S.; Law, K. J. H.; Morozovska, A. N. Nature Communications, Vol. 9, Issue 1 https://doi.org/10.1038/s41467-017-02455-7	journal	February 2018
Deep data analysis via physically constrained linear unmixing: universal framework, domain examples, and a community-wide platform Kannan, R.; Ievlev, A. V.; Laanait, N. Advanced Structural and Chemical Imaging, Vol. 4, Issue 1 https://doi.org/10.1186/s40679-018-0055-8	journal	April 2018
Mapping fast evolution of transient surface photovoltage dynamics using G-Mode Kelvin probe force microscopy Collins, Liam; Ahmadi, Mahshid; Qin, Jiajun arXiv https://doi.org/10.48550/arxiv.1802.06102	preprint	January 2018
Recent advances in hybrid measurement methods based on atomic force microscopy and surface sensitive measurement techniques Handschuh-Wang, Stephan; Wang, Tao; Zhou, Xuechang RSC Adv., Vol. 7, Issue 75 https://doi.org/10.1039/c7ra08515j	journal	January 2017
Nanoscale dipole dynamics of protein membranes studied by broadband dielectric microscopy Gramse, Georg; Schönhals, Andreas; Kienberger, Ferry Nanoscale, Vol. 11, Issue 10 https://doi.org/10.1039/c8nr05880f	journal	January 2019
Quantitative comparison of closed-loop and dual harmonic Kelvin probe force microscopy techniques Kilpatrick, Jason I.; Collins, Liam; Weber, Stefan A. L. Review of Scientific Instruments, Vol. 89, Issue 12 https://doi.org/10.1063/1.5025432	journal	December 2018
Effect of epitaxial strain and vacancies on the ferroelectric-like response of CaTiO ₃ thin films Sarantopoulos, A.; Ong, Wee-Liat; Malen, Jonathan A. Applied Physics Letters, Vol. 113, Issue 18 https://doi.org/10.1063/1.5053857	journal	October 2018
Time resolved surface photovoltage measurements using a big data capture approach to KPFM Collins, Liam; Ahmadi, Mahshid; Qin, Jiajun Nanotechnology, Vol. 29, Issue 44 https://doi.org/10.1088/1361-6528/aad873	journal	September 2018
Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review Collins, Liam; Kilpatrick, Jason I.; Kalinin, Sergei V. Reports on Progress in Physics, Vol. 81, Issue 8 https://doi.org/10.1088/1361-6633/aab560	journal	July 2018
Production and processing of graphene and related materials Backes, Claudia; Abdelkader, Amr M.; Alonso, Concepción 2D Materials, Vol. 7, Issue 2 https://doi.org/10.1088/2053-1583/ab1e0a	journal	January 2020
Mapping intrinsic electromechanical responses at the nanoscale via sequential excitation scanning probe microscopy empowered by deep data Huang, Boyuan; Esfahani, Ehsan Nasr; Li, Jiangyu National Science Review, Vol. 6, Issue 1 https://doi.org/10.1093/nsr/nwy096	journal	September 2018
Materials science in the artificial intelligence age: high-throughput library generation, machine learning, and a pathway from correlations to the underpinning physics Vasudevan, Rama K.; Choudhary, Kamal; Mehta, Apurva MRS Communications, Vol. 9, Issue 3 https://doi.org/10.1557/mrc.2019.95	journal	July 2019
Production and processing of graphene and related materials Backes, C.; Abdelkader, Am; Alonso, C. Apollo - University of Cambridge Repository https://doi.org/10.17863/cam.63418	text	January 2020
Production and processing of graphene and related materials Backes, Claudia; Abdelkader, Amr M.; Alonso, Concepción RWTH Aachen University https://doi.org/10.18154/rwth-2020-02443	text	January 2020
Mapping Intrinsic Electromechanical Responses at the Nanoscale via Sequential Excitation Scanning Probe Microscopy Empowered by Deep Data Huang, Boyuan; Esfahani, Ehsan Nasr; Li, Jiangyu arXiv https://doi.org/10.48550/arxiv.1808.05937	text	January 2018

Similar Records

Band excitation Kelvin probe force microscopy utilizing photothermal excitation

Journal Article · Mon Mar 09 00:00:00 EDT 2015 · Applied Physics Letters · OSTI ID:22395737

Band Excitation Kelvin probe force microscopy utilizing photothermal excitation

Journal Article · Thu Mar 12 20:00:00 EDT 2015 · Applied Physics Letters · OSTI ID:1265398

Kelvin Probe Force Microscopy in liquid using Electrochemical Force Microscopy

Journal Article · Sun Jan 18 19:00:00 EST 2015 · Beilstein Journal of Nanotechnology · OSTI ID:1185854

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY

Full data acquisition in Kelvin Probe Force Microscopy: Mapping dynamic electric phenomena in real space

Citation Formats

References (54)

Cited By (16)

Similar Records

Related Subjects