Band Excitation Kelvin probe force microscopy utilizing photothermal excitation

Collins, Liam; Jesse, Stephen; Balke, Nina; Rodriguez, Brian J.; Kalinin, Sergei; Li, Qian

doi:10.1063/1.4913910

Title: Band Excitation Kelvin probe force microscopy utilizing photothermal excitation

Journal Article · Fri Mar 13 00:00:00 EDT 2015 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4913910· OSTI ID:1265398

Collins, Liam ^[1]; Jesse, Stephen ^[2]; Balke, Nina ^[2]; Rodriguez, Brian J. ^[1]; Kalinin, Sergei ^[2]; Li, Qian ^[2]

University College Dublin, Belfield, Dublin (Ireland)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Science (CNMS)

A multifrequency open loop Kelvin probe force microscopy (KPFM) approach utilizing photothermal as opposed to electrical excitation is developed. Photothermal band excitation (PthBE)-KPFM is implemented here in a grid mode on a model test sample comprising a metal-insulator junction with local charge-patterned regions. Unlike the previously described open loop BE-KPFM, which relies on capacitive actuation of the cantilever, photothermal actuation is shown to be highly sensitive to the electrostatic force gradient even at biases close to the contact potential difference (CPD). PthBE-KPFM is further shown to provide a more localized measurement of true CPD in comparison to the gold standard ambient KPFM approach, amplitude modulated KPFM. In conclusion, PthBE-KPFM data contain information relating to local dielectric properties and electronic dissipation between tip and sample unattainable using conventional single frequency KPFM approaches.

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Research Organization:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1265398

Journal Information:: Applied Physics Letters, Vol. 106, Issue 10; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 15 works

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Deep neural networks for understanding noisy data applied to physical property extraction in scanning probe microscopy Borodinov, Nikolay; Neumayer, Sabine; Kalinin, Sergei V. npj Computational Materials, Vol. 5, Issue 1 https://doi.org/10.1038/s41524-019-0148-5	journal	February 2019
Fast time-resolved electrostatic force microscopy: Achieving sub-cycle time resolution Karatay, Durmus U.; Harrison, Jeffrey S.; Glaz, Micah S. Review of Scientific Instruments, Vol. 87, Issue 5 https://doi.org/10.1063/1.4948396	journal	May 2016
Multifrequency spectrum analysis using fully digital G Mode-Kelvin probe force microscopy Collins, Liam; Belianinov, Alex; Somnath, Suhas Nanotechnology, Vol. 27, Issue 10 https://doi.org/10.1088/0957-4484/27/10/105706	journal	February 2016
Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review Collins, Liam; Kilpatrick, Jason I.; Kalinin, Sergei V. Reports on Progress in Physics, Vol. 81, Issue 8 https://doi.org/10.1088/1361-6633/aab560	journal	July 2018

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