Open-loop Band excitation Kelvin Probe Force Microscopy

Journal Article · Sat Dec 31 23:00:00 EST 2011 · Nanotechnology

DOI:https://doi.org/10.1088/0957-4484/23/12/125704· OSTI ID:1042850

Guo, Senli ^[1]; Kalinin, Sergei V ^[1]; Jesse, Stephen ^[1]

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1. ORNL

A multidimensional scanning probe microscopy approach for quantitative, cross-talk free mapping of surface electrostatic properties is demonstrated. Open-loop band excitation Kelvin probe force microscopy (OL BE KPFM) probes the full response-frequency-potential surface at each pixel at standard imaging rates. The subsequent analysis reconstructs work function, tip surface capacitance gradient and resonant frequency maps, obviating feedback-related artifacts. OL BE KPFM imaging is demonstrated for several materials systems with topographic, potential and combined contrast. This approach combines the features of both frequency and amplitude KPFM and allows complete decoupling of topographic and voltage contributions to the KPFM signal.

• Research Organization: Oak Ridge National Laboratory (ORNL); Center for Nanophase Materials Sciences
• Sponsoring Organization: SC USDOE - Office of Science (SC)
• DOE Contract Number: AC05-00OR22725
• OSTI ID: 1042850
• Journal Information: Nanotechnology, Journal Name: Nanotechnology Journal Issue: 12 Vol. 23; ISSN 0957-4484
• Country of Publication: United States
• Language: English

Related Subjects

77 NANOSCIENCE AND NANOTECHNOLOGY
AMPLITUDES
CAPACITANCE
DECOUPLING
ELECTROSTATICS
EXCITATION
MICROSCOPY
Open-loop BE KPFM
PROBES
WORK FUNCTIONS