Mylar capacitor edge margin reduction using dielectric inks.
Conference
·
OSTI ID:1641614
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1641614
- Report Number(s):
- SAND2019-9434C; 678410
- Resource Relation:
- Conference: Proposed for presentation at the Solid Freeform Fabrication held August 12-14, 2019 in Austin, Texas, United States.
- Country of Publication:
- United States
- Language:
- English
Similar Records
Gel capacitor edge margin reduction using robust dielectric materials.
Prefilling Mylar Capacitor Edge Margins to Improve Capacitor Reliability and Size.
Prefilling Mylar Capacitor Edge Margins to Improve Capacitor Reliability and Size.
Conference
·
Mon Oct 01 00:00:00 EDT 2018
·
OSTI ID:1641614
+5 more
Prefilling Mylar Capacitor Edge Margins to Improve Capacitor Reliability and Size.
Thesis/Dissertation
·
Sun Nov 01 00:00:00 EDT 2020
·
OSTI ID:1641614
Prefilling Mylar Capacitor Edge Margins to Improve Capacitor Reliability and Size.
Thesis/Dissertation
·
Thu Oct 01 00:00:00 EDT 2020
·
OSTI ID:1641614