Gel capacitor edge margin reduction using robust dielectric materials.
Conference
·
OSTI ID:1594263
Abstract not provided.
- Research Organization:
- Sandia National Laboratories (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1594263
- Report Number(s):
- SAND2018-11436C; 669411
- Country of Publication:
- United States
- Language:
- English
Similar Records
Mylar capacitor edge margin reduction using dielectric inks.
Capacitor Edge Margin.
Nitrated Poly(ethylene terephthalate) as a Dielectric Material for Capacitors - Presentation.
Conference
·
Thu Aug 01 00:00:00 EDT 2019
·
OSTI ID:1641614
Capacitor Edge Margin.
Conference
·
Sun Jul 01 00:00:00 EDT 2018
·
OSTI ID:1806788
Nitrated Poly(ethylene terephthalate) as a Dielectric Material for Capacitors - Presentation.
Conference
·
Tue Oct 01 00:00:00 EDT 2013
·
OSTI ID:1143832