Method of characterizing the anisotropic, complex dielectric constant for materials with small dimensions

Guo, Peijun; Schaller, Richard D.

Title: Method of characterizing the anisotropic, complex dielectric constant for materials with small dimensions

Patent · Tue Nov 12 00:00:00 EST 2019

OSTI ID:1600280

Guo, Peijun; Schaller, Richard D.

A dielectric-coating based technique determines the refractive index of small dimension materials. The technique utilizes a sample of the small dimension material coated with the dielectric and an uncoated sample, where reflectivity is determined for each. The real and imaginary components of the refractive index can be determined for the small-dimension material itself.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE

DOE Contract Number:: AC02-06CH11357

Assignee:: UChicago Argonne, LLC (Chicago, IL)

Patent Number(s):: 10,475,710

Application Number:: 16/035,330

OSTI ID:: 1600280

Resource Relation:: Patent File Date: 07/13/2018

Country of Publication:: United States

Language:: English

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