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Title: Defect-engineered epitaxial VO 2±δ in strain engineering of heterogeneous soft crystals

Journal Article · · Science Advances
ORCiD logo [1]; ORCiD logo [2];  [1];  [3];  [3];  [2];  [1]
  1. Rensselaer Polytechnic Inst., Troy, NY (United States). Dept. of Materials Science and Engineering
  2. Rensselaer Polytechnic Inst., Troy, NY (United States). Dept. of Physics, Applied Physics, and Astronomy
  3. Argonne National Lab. (ANL), Argonne, IL (United States). X-ray Science Division

The success of strain engineering has made a step further for the enhancement of material properties and the introduction of new physics, especially with the discovery of the critical roles of strain in the heterogeneous interface between two dissimilar materials (for example, FeSe/SrTiO3). On the other hand, the strain manipulation has been limited to chemical epitaxy and nanocomposites that, to a large extent, limit the possible material systems that can be explored. By defect engineering, we obtained, for the first time, dense three-dimensional strongly correlated VO2±$$\delta$$ epitaxial nanoforest arrays that can be used as a novel "substrate" for dynamic strain engineering, due to its metal-insulator transition. The highly dense nanoforest is promising for the possible realization of bulk strain similar to the effect of nanocomposites. By growing single-crystalline halide perovskite CsPbBr3, a mechanically soft and emerging semiconducting material, onto the VO2±$$\delta$$, a heterogeneous interface is created that can entail a ~1% strain transfer upon the metal-insulator transition of VO2±$$\delta$$. This strain is large enough to trigger a structural phase transition featured by PbX6 octahedral tilting along with a modification of the photoluminescence energy landscape in halide perovskite. Our findings suggest a promising strategy of dynamic strain engineering in a heterogeneous interface carrying soft and strain-sensitive semiconductors that can happen at a larger volumetric value surpassing the conventional critical thickness limit.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
Sponsoring Organization:
Rensselaer Polytechnic Institute; Air Force Research Laboratory (AFRL). Air Force Office of Scientific Research (AFOSR); National Science Foundation (NSF); USDOE
Grant/Contract Number:
AC02-06CH11357
OSTI ID:
1468627
Journal Information:
Science Advances, Vol. 4, Issue 5; ISSN 2375-2548
Publisher:
AAASCopyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 39 works
Citation information provided by
Web of Science

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Cited By (5)

Thickness effects on the epitaxial strain states and phase transformations in (001)-VO 2 /TiO 2 thin films journal February 2019
Epitaxial Liftoff of Wafer‐Scale VO 2 Nanomembranes for Flexible, Ultrasensitive Tactile Sensors journal April 2019
Recent advances in fabrication strategies, phase transition modulation, and advanced applications of vanadium dioxide journal March 2019
Gate-controlled VO 2 phase transition for high-performance smart windows journal March 2019
Gate-Controlled VO2 Phase Transition for High-Performance Smart Window text January 2018

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