Analysis of TID Process Geometry and Bias Condition Dependence of 14-nm FinFETs and Implications for RF and SRAM Performance.
Abstract not provided.
- Research Organization:
- Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE National Nuclear Security Administration (NNSA)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 1420372
- Report Number(s):
- SAND2016-4618C; 640237
- Resource Relation:
- Journal Volume: 64; Journal Issue: 1; Conference: Proposed for presentation at the NSREC.
- Country of Publication:
- United States
- Language:
- English
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