Experimental tests on double-resolution coherent imaging via STEM
|
journal
|
March 1993 |
Quantitative Measurements of Magnetic Vortices using Position Resolved Diffraction in Lorentz Stem
|
journal
|
August 2002 |
Direct Imaging of Nanoscale Phase Separation in : Relationship to Colossal Magnetoresistance
|
journal
|
August 2009 |
Spatially resolved diffractometry with atomic-column resolution
|
journal
|
July 2011 |
Recording and Using 4D-STEM Datasets in Materials Science
|
journal
|
August 2014 |
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction
|
journal
|
December 2014 |
Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution
|
journal
|
April 2015 |
Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions
|
journal
|
April 2015 |
Position averaged convergent beam electron diffraction: Theory and applications
|
journal
|
January 2010 |
Energy dispersive X-ray analysis on an absolute scale in scanning transmission electron microscopy
|
journal
|
October 2015 |
Quantum mechanical model for phonon excitation in electron diffraction and imaging using a Born-Oppenheimer approximation
|
journal
|
September 2010 |
Modelling the inelastic scattering of fast electrons
|
journal
|
April 2015 |
Diffraction contrast imaging using virtual apertures
|
journal
|
August 2015 |
Influence of electron dose rate on electron counting images recorded with the K2 camera
|
journal
|
November 2013 |
Quantitative characterization of electron detectors for transmission electron microscopy
|
journal
|
December 2013 |
Quantitative comparison of high resolution TEM images with image simulations
|
journal
|
March 1994 |
High-Resolution Transmission Electron Microscopy on an Absolute Contrast Scale
|
journal
|
June 2009 |
Quantitative Atomic Resolution Scanning Transmission Electron Microscopy
|
journal
|
May 2008 |
Quantitative comparisons of contrast in experimental and simulated bright-field scanning transmission electron microscopy images
|
journal
|
November 2009 |
Experimental quantification of annular dark-field images in scanning transmission electron microscopy
|
journal
|
November 2008 |
Sub-0.1 nm-resolution quantitative scanning transmission electron microscopy without adjustable parameters
|
journal
|
May 2012 |
Two-Dimensional Transition Metal Dichalcogenides under Electron Irradiation: Defect Production and Doping
|
journal
|
July 2012 |
Effects of tilt on high-resolution ADF-STEM imaging
|
journal
|
July 2008 |
Effects of amorphous layers on ADF-STEM imaging
|
journal
|
July 2008 |
The direct determination of magnetic domain wall profiles by differential phase contrast electron microscopy
|
journal
|
January 1978 |
Differential phase-contrast microscopy at atomic resolution
|
journal
|
June 2012 |
Differential phase contrast 2.0—Opening new “fields” for an established technique
|
journal
|
June 2012 |
Towards quantitative, atomic-resolution reconstruction of the electrostatic potential via differential phase contrast using electrons
|
journal
|
December 2015 |
Differential phase contrast: An integral perspective
|
journal
|
February 2015 |
Electron Microscopy of Probability Currents at Atomic Resolution
|
journal
|
October 2015 |
Ptychography and Related Diffractive Imaging Methods
|
book
|
May 2008 |
An improved ptychographical phase retrieval algorithm for diffractive imaging
|
journal
|
September 2009 |
Deterministic electron ptychography at atomic resolution
|
journal
|
February 2014 |
Method to measure spatial coherence of subangstrom electron beams
|
journal
|
July 2008 |
Enhanced Detection Sensitivity with a New Windowless XEDS System for AEM Based on Silicon Drift Detector Technology
|
journal
|
July 2010 |
High Dynamic Range Pixel Array Detector for Scanning Transmission Electron Microscopy
|
journal
|
January 2016 |
Detective quantum efficiency of electron area detectors in electron microscopy
|
journal
|
August 2009 |
Point defect characterization in HAADF-STEM images using multivariate statistical analysis
|
journal
|
February 2011 |
The Scree Test For The Number Of Factors
|
journal
|
April 1966 |
Big Data Analytics for Scanning Transmission Electron Microscopy Ptychography
|
journal
|
May 2016 |
Structure determination of metal-ceramic interfaces by numerical contrast evaluation of HRTEM micrographs
|
journal
|
November 1994 |