A deep convolutional neural network to analyze position averaged convergent beam electron diffraction patterns
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May 2018 |
Method to measure spatial coherence of subangstrom electron beams
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July 2008 |
Computation in electron microscopy
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January 2016 |
A survey of decision tree classifier methodology
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January 1991 |
Big Data Analytics for Scanning Transmission Electron Microscopy Ptychography
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May 2016 |
Efficient phase contrast imaging in STEM using a pixelated detector. Part II: Optimisation of imaging conditions
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April 2015 |
Jointed magnetic skyrmion lattices at a small-angle grain boundary directly visualized by advanced electron microscopy
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October 2016 |
Comparison of optimal performance at 300keV of three direct electron detectors for use in low dose electron microscopy
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December 2014 |
Direct Visualization of Local Electromagnetic Field Structures by Scanning Transmission Electron Microscopy
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July 2017 |
Deep Learning of Atomically Resolved Scanning Transmission Electron Microscopy Images: Chemical Identification and Tracking Local Transformations
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October 2016 |
Non-spectroscopic composition measurements of SrTiO 3 -La 0.7 Sr 0.3 MnO 3 multilayers using scanning convergent beam electron diffraction
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February 2017 |
Characterizing the response of a scintillator-based detector to single electrons
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February 2016 |
Electron counting and beam-induced motion correction enable near-atomic-resolution single-particle cryo-EM
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May 2013 |
Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures
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August 2016 |
Identifying and Correcting Scan Noise and Drift in the Scanning Transmission Electron Microscope
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May 2013 |
Optimizing disk registration algorithms for nanobeam electron diffraction strain mapping
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May 2017 |
Efficient phase contrast imaging in STEM using a pixelated detector. Part 1: Experimental demonstration at atomic resolution
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journal
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April 2015 |
Convolutional Neural Networks for Sentence Classification
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conference
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January 2014 |
Picometre-precision analysis of scanning transmission electron microscopy images of platinum nanocatalysts
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June 2014 |
Supporting user-oriented analysis for multi-view domain-specific visual languages
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April 2009 |
Strain mapping at nanometer resolution using advanced nano-beam electron diffraction
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June 2015 |
Quantitative Atomic Resolution Scanning Transmission Electron Microscopy
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May 2008 |
Deep Convolutional Neural Networks for Computer-Aided Detection: CNN Architectures, Dataset Characteristics and Transfer Learning
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May 2016 |
A streaming multi-GPU implementation of image simulation algorithms for scanning transmission electron microscopy
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October 2017 |
Electron ptychographic microscopy for three-dimensional imaging
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July 2017 |
Nanoscale quantification of octahedral tilts in perovskite films
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May 2012 |
Non-rigid registration and non-local principle component analysis to improve electron microscopy spectrum images
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August 2016 |
Applications of direct detection device in transmission electron microscopy
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March 2008 |
Electron ptychography of 2D materials to deep sub-ångström resolution
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July 2018 |
High-precision scanning transmission electron microscopy at coarse pixel sampling for reduced electron dose
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March 2015 |
Poisson noise removal from high-resolution STEM images based on periodic block matching
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March 2015 |
Measurement of effective source distribution and its importance for quantitative interpretation of STEM images
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journal
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July 2010 |
A pnCCD-based, fast direct single electron imaging camera for TEM and STEM
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April 2016 |
Determining ferroelectric polarity at the nanoscale
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January 2011 |
Crystal Graph Convolutional Neural Networks for an Accurate and Interpretable Prediction of Material Properties
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April 2018 |
Atomic electric fields revealed by a quantum mechanical approach to electron picodiffraction
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December 2014 |
Accuracy and precision of thickness determination from position-averaged convergent beam electron diffraction patterns using a single-parameter metric
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October 2017 |
Direct determination of structural heterogeneity in metallic glasses using four-dimensional scanning transmission electron microscopy
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journal
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December 2018 |
Position averaged convergent beam electron diffraction: Theory and applications
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journal
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January 2010 |
Standardless Atom Counting in Scanning Transmission Electron Microscopy
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journal
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November 2010 |